Advances in scanned probe microscopy
ORAL · N31 · ID: 48294
Presentations
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UHV Compatible Negative Stiffness Vibrational Isolator for STM
ORAL
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Presenters
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Arnav Srivastava
Harvard University
Authors
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Arnav Srivastava
Harvard University
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Wan-Ting Liao
Harvard University
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Jenny E Hoffman
Harvard, Harvard University
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Adding RF capabilities to a mK-STM for capacitance measurements
ORAL
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Presenters
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Michael Dreyer
University of Maryland, College Park
Authors
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Michael Dreyer
University of Maryland, College Park
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Jonathan J Marbey
Laboratory for Physical Science
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Robert E Butera
Laboratory for Physical Sciences
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Resolving nanoscale mechanical properties of multi-layered low-k dielectric films by contact resonance atomic force microscopy
ORAL
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Presenters
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Gheorghe Stan
National Institute of Standards and Tech
Authors
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Gheorghe Stan
National Institute of Standards and Tech
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Sean W King
Intel Corporation, Hillsboro, Oregon 97124
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Characterizing Charged Defects in Oxide-on-Silicon using Kelvin Probe Force Microscopy
ORAL
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Presenters
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Leah Tom
University of Wisconsin - Madison
Authors
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Leah Tom
University of Wisconsin - Madison
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Zachary J Krebs
University of Wisconsin - Madison, University of Wisconsin-Madison
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Justin T White
University of Wisconsin-Madison
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Wyatt A Behn
University of Wisconsin - Madison
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Mark A Eriksson
University of Wisconsin - Madison
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Victor W Brar
University of Wisconsin - Madison, Caltech
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Sue N Coppersmith
University of New South Wales
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Mark G Friesen
University of Wisconsin - Madison
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Using functionalized tips mounted on noncontact atomic force microscope to break chemical bonds within molecules – a computational perspective
ORAL
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Publication: Chen, P., Fan, D., Zhang, Y. et al. Breaking a dative bond with mechanical forces. Nat Commun 12, 5635 (2021). https://doi.org/10.1038/s41467-021-25932-6
Presenters
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Dingxin Fan
University of Texas at Austin
Authors
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Dingxin Fan
University of Texas at Austin
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James R Chelikowsky
University of Texas at Austin, Texas Center for Superconductivity and Department of Chemistry, University of Houston, Houston, TX 77204, USA
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Scanning Probe Microscopy Combined with Low Temperature Cryogen-free Operation in an Ultra-High Vacuum High Field Environment
ORAL
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Presenters
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Angela M Coe
Rutgers University
Authors
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Angela M Coe
Rutgers University
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Guohong Li
Rutgers University, New Brunswick
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Eva Y Andrei
Rutgers University, Rutgers University, Department of Physics and Astronomy, 136 Frelinghuysen Rd, Piscataway, 08854, New Jersey, USA
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Scattering-Type Scanning Near-Field Optical Microscopy with Akiyama Piezo-Probes
ORAL
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Publication: M. Dapolito, X. Chen, C. Li, M. Tsuneto, S. Zhang, X. Du, M. Liu, and A. Gozar, "Scattering-type Scanning Near-field Optical Microscopy with Akiyama Piezo-Probes," Applied Physics Letters (2021) (submitted)
Presenters
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Michael Dapolito
Stony Brook University (SUNY)
Authors
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Michael Dapolito
Stony Brook University (SUNY)
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Xinzhong Chen
Stony Brook University (SUNY), State Univ of NY - Stony Brook
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Chaoran Li
Binghamton University
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Makoto Tsuneto
Stony Brook University
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Shuai Zhang
Columbia University
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Jennifer Cano
Stony Brook University; Flatiron Institute, Stony Brook University (SUNY) / Flatiron Institute, State Univ of NY - Stony Brook, Stony Brook University, Stony Brook University (SUNY), Stony Brook University, Flatiron Institute
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Adrian Gozar
Yale University
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Mengkun Liu
State Univ of NY - Stony Brook
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Advanced numerical modeling of light-matter interactions at nanometer length scales
ORAL
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Presenters
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Haoyue Jiang
College of William and Mary, Department of Physics, College of William & Mary
Authors
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Haoyue Jiang
College of William and Mary, Department of Physics, College of William & Mary
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Patrick McArdle
College of William & Mary
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David J Lahneman
College of William and Mary, Department of Physics, College of William & Mary
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M.Mumtaz Qazilbash
College of William and Mary, Department of Physics, College of William & Mary, College of William & Mary
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Tetiana Slusar
ETRI
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Hyun-Tak Kim
ETRI
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Amlan Biswas
University of Florida
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Jingyi Chen
University of Arkansas
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Compensation of electrostatically-induced background in s-SNOM.
ORAL
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Publication: Tobias Nörenberg, Lukas Wehmeier, Denny Lang, Susanne C. Kehr, and Lukas M. Eng , "Compensating for artifacts in scanning near-field optical microscopy due to electrostatics", APL Photonics 6, 036102 (2021) https://doi.org/10.1063/5.0031395
Presenters
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Artem Danilov
Attocube systems AG
Authors
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Artem Danilov
Attocube systems AG
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Modifying plasmon resonances at nanocavities by molecular adsorption: A Scanning Tunnelling Microscopy Study
ORAL
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Presenters
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Óscar Jover Arrate
Universidad Autónoma de Madrid
Authors
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Óscar Jover Arrate
Universidad Autónoma de Madrid
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Koen Lauwaet
IMDEA Nanoscience
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Roberto Otero
Universidad Autónoma de Madrid; IMDEA Nanoscience
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Scanning Gradiometry of Magnetic and Electric Fields with a Single Nitrogen-Vacancy Sensor
ORAL
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Presenters
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William S Huxter
ETH Zurich
Authors
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William S Huxter
ETH Zurich
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Marius L Palm
ETH Zurich
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Miranda L Davis
ETH Zurich
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Christian L Degen
ETH Zurich
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