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Engineering of Interlayer Electronic and Mechanical Coupling in Bilayer MoS<sub>2</sub> by Applying Gigapascal High Pressure

ORAL

Abstract

Interlayer electronic and mechanical coupling plays a critical role in determining the novel electronic properties of van der Waal (vdW) bilayers. In particular, the coupling strength is determined by the stacking configuration and the interlayer spacing. While the former has been well established, the influence of interlayer spacing remains largely unexplored. Here, by measuring the optical absorption and Raman mode of the bilayer MoS2 in a high-pressure diamond anvil cell, we quantitatively determined the coupling strength of the electronic band and phonon mode. All experimental results are supported by theoretical calculations. Our work has confirmed the great potential in tailoring vdW bilayers through gigapascal high pressure.

Presenters

  • Wei-Ting Hsu

    Natl Tsing Hua Univ

Authors

  • Wei-Ting Hsu

    Natl Tsing Hua Univ

  • Jiamin Quan

    University of Texas at Austin

  • Joshua A Leveillee

    University of Texas at Austin

  • Chi-Ruei Pan

    Academia Sinica

  • Mei-Yin Chou

    Institute of Atomic and Molecular Sciences, Academia Sinica, Taiwan, Academia Sinica, Taiwan, Academia Sinica

  • Wen-Hao Chang

    Academia Sinica

  • Xiaoqin (Elaine) Li

    University of Texas at Austin

  • Feliciano Giustino

    University of Texas at Austin, University of Texas

  • Jung-Fu Lin

    University of Texas at Austin, Department of Geological Sciences, Jackson School of Geosciences, The University of Texas at Austin, Austin, TX 78712, USA

  • Chih-Kang Shih

    University of Texas at Austin