Antisite defects stabilized by antiphase boundaries in multiferroic YFeO<sub>3</sub> thin films
ORAL
Abstract
–
Publication: Abinash Kumar, Konstantin Klyukin, Shuai Ning, Cigdem Ozsoy-Keskinbora, Mikhail Ovsyanko, Felix van Uden, Ruud Krijnen, Bilge Yildiz, Caroline A. Ross, James M. LeBeau, Antisite defects stabilized by antiphase boundaries in YFeO3 thin films. arXiv:2107.09152 (2021).
Presenters
-
James M LeBeau
Massachusetts Institute of Technology, Department of Materials Science & Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA
Authors
-
James M LeBeau
Massachusetts Institute of Technology, Department of Materials Science & Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA
-
Abinash Kumar
Massachusetts Institute of Technology
-
Shuai Ning
Massachusetts Institute of Technology MIT
-
Konstantin Klyukin
Massachusetts Institute of Technology MIT
-
Cigdem Ozsoy-Keskinbora
Thermo Fisher Scientific
-
mikhail ovsyanko
Thermo Fisher Scientific
-
Felix van Uden
Thermo Fisher Scientific
-
Ruud Krijnen
Thermo Fisher Scientific
-
Bilge Yildiz
Massachusetts Institute of Technology MI, Massachusetts Institute of Technology
-
Caroline A Ross
Massachusetts Institute of Technology MIT