Characterization of mid-circuit measurement on multi-qubit devices

The ability to perform measurements between, or simultaneous with, the application of quantum gates is known as mid-circuit measurement. It is a key building block in many approaches to fault-tolerant quantum computation, such as for syndrome extraction, and necessary in paradigms such as measurement-based quantum computation. Here, we present our development of a modified version of quantum process tomography, and an interleaved benchmarking sequence that can be used to characterize the cross-chip impact of mid-circuit measurement. We demonstrate these techniques on superconducting multi-qubit devices available over the IBM cloud.