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Effects of Boron diffusion on the surface Néel temperature revealed by magnetotransport and cold neutron depth profiling in B-doped Cr<sub>2</sub>O<sub>3</sub> films

ORAL

Abstract

Multi-functional thin films of boron (B) doped Cr2O3 grown by pulsed laser deposition exhibit voltage-controlled and nonvolatile Néel vector reorientation in the absence of a magnetic field. Isothermal toggling of antiferromagnetic states is demonstrated in prototype device structures at CMOS compatible temperatures between 300 and 400 K. Although isothermal switching is achieved, selecting a single domain state via a magnetoelectric annealing protocol is hampered most likely by a thermally activated runaway effect of the Néel temperature. This behavior can be understood by considering B diffusion within the thin Cr2O3 film. Cold Neutron Depth Profiling (cNDP), performed at National Institute of Standards and Technology, points at progressing depletion of B atoms in the bulk with temperature. At the same time the B-concentration increases near the surface. The Spin Hall measurements, sensitive to the surface magnetic state, indicate a shift in TN towards higher values associated with the increase in B-concentration near the film surface.

Publication: Voltage controlled Néel vector rotation in zero magnetic field<br>Ather Mahmood Will Echtenkamp, Mike Street, Jun-Lei Wang, Shi Cao, Takashi Komesu, Peter A. Dowben, Pratyush Buragohain, Haidong Lu, Alexei Gruverman, Arun Parthasarathy, Shaloo Rakheja, Christian Binek. Nat Commun 12, 1674 (2021).

Presenters

  • Ather Mahmood

    University of Nebraska - Lincoln

Authors

  • Syed Qamar Abbas Shah

    University of Nebraska - Lincoln

  • Ather Mahmood

    University of Nebraska - Lincoln

  • Will Echtenkamp

    University of Nebraska - Lincoln

  • Jamie L Weaver

    National Institute of Standards and Technology, Material Measurement Laboratory, National Institute of Standards and Technology

  • Jeffrey W Lynn

    National Institute of Standards and Tech, National Institute of Standards and Technology

  • Christian Binek

    University of Nebraska - Lincoln