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Ultrathin SiNx nanopore membranes fabricated using the SiO<sub>2</sub> sacrificial layer process

ORAL

Abstract

SiN membranes with thicknesses of 3-7 nm were fabricated using the SiO2 sacrificial layer process. Then, nanopores were fabricated in the membranes via dielectric breakdown. The current noise of the nanopore membranes was approximately 3/5 that of membranes fabricated using the conventional poly-Si sacrificial layer process. In addition, ionic current blockades were measured when poly(dT)60 passed through the nanopores, and the effective thickness of the nanopores was estimated based on those current-blockade values. The effective thickness was approximately 4.8 nm when the deposited thickness of the SiN membrane was 6.03 nm. On the other hand, the effective thickness and the actual thickness were almost the same when the deposited thickness was 3.07 nm. This suggests the difficulty of forming the shape in which the membrane was thinner only near the nanopore than in the other area as the actual thickness decreased. 

Publication: Itaru Yanagi and Ken-ichi Takeda 2021 Nanotechnology 32 415301

Presenters

  • Itaru Yanagi

    Hitachi Ltd

Authors

  • Itaru Yanagi

    Hitachi Ltd

  • Kenichi Takeda

    Hitachi, Ltd