New Advances in ARPES instrumentation: DFS30

   In this talk we present ground-breaking Electrostatic 3D Focus Adjustment technology (patent pending) - a major advancement in replacing imprecise mechanical movements with electronic precision and repeatability in ARPES. This provides significantly improved workflow, speed, and reproducibility when optimizing experimental conditions. High quality ARPES measurements, particularly micro/nanoARPES, require optimised alignment of the photon, sample, and analyser focal point. The new DFS30 spectrometer simplifies this with electronic adjustment of the analyser focal point.

   ARPES measurements require time consuming, iterative alignment of sample position and light source to match the photoelectron emission spot with the analyser focal point. We show that without optimal alignment deflection mode measurement performance is reduced. The Electrostatic 3D Focus Adjustment technology generates dynamic lens tables in real time for deflection, angular and transmission modes. Calibrated electronic shifting of the analyser focal point in three dimensions generates these dynamic lens tables. We will show how the alignment of focal point and emission source is particularly important in micro/nanoARPES applications as it scales with both smaller spot sizes and lower kinetic energies.