Defects in Nitride Materials
FOCUS · D67 · ID: 47637
Presentations
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First-principles calculations of point defects and impurities in nitride semiconductors
ORAL · Invited
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Presenters
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Darshana Wickramaratne
United States Naval Research Laboratory
Authors
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Darshana Wickramaratne
United States Naval Research Laboratory
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Modeling of color tunable light-emitting diodes with Eu-doped GaN active layers
ORAL
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Presenters
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Hayley J Austin
Lehigh University
Authors
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Hayley J Austin
Lehigh University
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Brandon Mitchell
West Chester University
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Jun Tatebayashi
Osaka University
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Yasufumi Fujiwara
Osaka University
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Volkmar G Dierolf
Lehigh Univ
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Deterministic creation of optically active defects in AlN towards integrated single photon emitters
ORAL
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Presenters
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Heejun Byeon
Sandia National Laboratories, Michigan State University
Authors
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Heejun Byeon
Sandia National Laboratories, Michigan State University
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Michael D Titze
Sandia National Laboratories
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Jacob D Henshaw
Sandia National Laboratories
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Deanna M Campbell
Sandia National Laboratories
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Peter A Schultz
Sandia National Laboratories
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George T Wang
Sandia National Laboratories
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Edward Bielejec
Sandia National Laboratories
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Michael P Lilly
Sandia National Laboratories
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Andrew M Mounce
Sandia National Laboratories, Sandia National Laboratory
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Optical Amplification from Er Optical Center in GaN in the Visible region
ORAL
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Presenters
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Jiarong R Cui
Virginia Tech
Authors
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Jiarong R Cui
Virginia Tech
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Ho X Vinh
Virginia Tech
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Ngoc L.H. Hoang
Department of Physics and Center for Soft Matter and Biological Physics, Virginia Tech, Blacksburg, Virginia 24061, United States, Virginia Tech
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Aidan Lentz
Virginia Tech
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Nusrat Jahan
Virginia Tech
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Vinh Q Nguyen
Department of Physics and Center for Soft Matter and Biological Physics, Virginia Tech, Blacksburg, Virginia 24061, United States, Virginia Tech
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Understanding radiative emissions in the vicinity of selected-area regrown GaN diodes
ORAL
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Publication: In preparation
Presenters
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Sam Frisone
University of Michigan
Authors
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Sam Frisone
University of Michigan
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Alexander Chang
Northwestern University
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Sizhen Wang
Yale University
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Bingjun Li
Yale University
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Rachel S Goldman
University of Michigan
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Lincoln J Lauhon
Northwestern University
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Jung Han
Yale University
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Temperature Dependence of Spectral Emission from GaN Defect Quantum Emitters
ORAL
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Presenters
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Yifei Geng
Cornell University
Authors
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Yifei Geng
Cornell University
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Jialun Luo
Cornell University
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Len H van Deurzen
Cornell University
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Debdeep Jena
Cornell University
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Gregory D Fuchs
School of Applied and Engineering Physics, Cornell University, Cornell University
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Farhan Rana
Cornell University
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Understanding the zincblende to wurtzite polytype transition during epitaxy of gallium nitride nanowires
ORAL
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Publication: Appl. Phys. Lett. 119, 031601 (2021)
Presenters
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Abby Liu
University of Michigan
Authors
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Abby Liu
University of Michigan
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Hongling Lu
University of Michigan
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Rachel S Goldman
University of Michigan
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A first principles study of n-doping of cubic boron nitride with carbon
ORAL
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Presenters
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Cyrille Armel Sayou Ngomsi
Howard University
Authors
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Cyrille Armel Sayou Ngomsi
Howard University
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Pratibha Dev
Howard University
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The Effect of Lattice Relaxation on Nitrogen Incorporation in GaAsN(Bi) Alloys
ORAL
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Publication: 1. M. Reason, H. McKay, W. Ye, S. Hanson, V. Rotberg, R.S. Goldman, Appl. Phys. Lett. 85, 1692 (2004).<br>2. T. Jen, G. Vardar, Y.Q. Wang, R.S. Goldman, Appl. Phys. Lett. 107, 221904 (2015).
Presenters
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Albert Tsui
University of Michigan
Authors
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Albert Tsui
University of Michigan
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Timothy Jen
University of Michigan, Intel Corp.
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Rachel S Goldman
University of Michigan
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Liang Qi
University of Michigan
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Inversion Domain Boundaries in Wurzite GaN
ORAL
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Publication: 10.1103/PhysRevB.103.165305
Presenters
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Mohamed Mauroof F Umar
Pennsylvania State University
Authors
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Mohamed Mauroof F Umar
Pennsylvania State University
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Jorge O Sofo
Pennsylvania State University
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Recovery mechanism of reverse leakage current in GaN HEMTs following thermal storage test
ORAL
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Publication: Mukherjee, Jayjit, Rupesh K. Chaubey, D. S. Rawal, and R. S. Dhaka. "Analysis of the post-stress recovery of reverse leakage current in GaN HEMTs." Materials Science in Semiconductor Processing 137 (2022): 106222.
Presenters
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Jayjit Mukherjee
Indian Institute of Technology, Delhi
Authors
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Jayjit Mukherjee
Indian Institute of Technology, Delhi
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Rupesh K Chaubey
Solid State Physics Laboratory, DRDO
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Dipendra S Rawal
Solid State Physics Laboratory, DRDO
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Rajendra S Dhaka
Department of Physics, Indian Institute of Technology Delhi, New Delhi-110016, India, Indian Institute of Technology, Delhi
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