Causality Analysis of Physical Parameters Derived from Atomic-Resolution STEM
ORAL
Abstract
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Publication: Ziatdinov, M., et al. Causal analysis of competing atomistic mechanisms in ferroelectric materials from high-resolution scanning transmission electron microscopy data. Comput Mater 6:127, 2020<br>Nelson, C., et al. Mapping causal patterns in crystalline solids. under review.
Presenters
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Christopher T Nelson
Oak Ridge National Lab
Authors
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Christopher T Nelson
Oak Ridge National Lab
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Maxim Ziatdinov
Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge National Laboratory, Oak Ridge National Lab
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Xiaohang Zhang
Department of Materials Science and Engineering, University of Maryland, College Park, MD 20742, USA, Nova Research, University of Maryland
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Rama K Vasudevan
Oak Ridge National Lab
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Eugene A. Eliseev
Institute for Problems of Materials Science, National Academy of Sciences of Ukraine, National Academy of Science of Ukraine
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Anna N. Morozovska
Institute of Physics, National Academy of Sciences of Ukraine, National Academy of Science of Ukraine
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Ichiro Takeuchi
University of Maryland, College Park, Department of Materials Science and Engineering, University of Maryland, College Park, MD 20742, USA
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Sergei V Kalinin
Oak Ridge National Lab, Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge National Laboratory