Characterization and Imaging of Defects

Presentations

• Understanding recombination-enhanced dislocation motion for reliable III-V on Si lasers

  ORAL · Invited

  March 14, 2022, 9:00 AM – March 14, 2022, 9:36 AM

  Publication: P.G. Callahan, B.B. Haidet, D. Jung, G.G.E. Seward, and K. Mukherjee, Phys. Rev. Materials 2, 081601 (2018).<br><br>J. Selvidge, E.T. Hughes, J.C. Norman, C. Shang, M.J. Kennedy, M. Dumont, A.M. Netherton, Z. Zhang, R.W. Herrick, J.E. Bowers, and K. Mukherjee, Appl. Phys. Lett. 118, 192101 (2021).<br><br>K. Mukherjee, J. Selvidge, D. Jung, J. Norman, A.A. Taylor, M. Salmon, A.Y. Liu, J.E. Bowers, and R.W. Herrick, Journal of Applied Physics 128, 025703 (2020).<br><br>

  Presenters

  • Kunal Mukherjee

    Stanford University

  Authors

  • Kunal Mukherjee

    Stanford University

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• Nanoscale imaging and spectroscopy of charge carrier distribution in doped Si nanowires with terahertz and mid infrared near-field nanoscopy

  ORAL

  March 14, 2022, 9:36 AM – March 14, 2022, 9:48 AM

  Presenters

  • Neda Aghamiri

    University of Georgia

  Authors

  • Neda Aghamiri

    University of Georgia

  • Gozde Tutuncuoglu

    Wayne State University

  • Alireza Fali

    University of Georgia

  • Michael Filler

    Georgia Tech

  • Yohannes Abate

    University of Georgia

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• Frequency-Modulated Charge Pumping of Single-Defects in MOSFETs with Ultra-Thin Gate Dielectrics

  ORAL

  March 14, 2022, 9:48 AM – March 14, 2022, 10:00 AM

  Publication: J.P. Ashton, M.A. Anders, J.T. Ryan, "Frequency-Modulated Charge Pumping Detection of Single Defects in Highly Scaled MOSFETs," IEEE Electron Device Letters, Submitted Sept. 17th, 2021

  Presenters

  • James P Ashton

    NIST

  Authors

  • James P Ashton

    NIST

  • Mark A Anders

    NIST

  • Jason T Ryan

    NIST

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• Frequency Multiplexed simultaneous Hall effect and resistivity transient measurements for van der Pauw samples

  ORAL

  March 14, 2022, 10:00 AM – March 14, 2022, 10:12 AM

  Presenters

  • Can C Aygen

    Northwestern University, Northwestern University Department of Electrical and Computer Engineering

  Authors

  • Can C Aygen

    Northwestern University, Northwestern University Department of Electrical and Computer Engineering

  • James Williams

    California Institute of Technology

  • Matthew Grayson

    Northwestern University, Northwestern University Department of Electrical and Computer Engineering

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• Analyzing Buried Defects in Vanadium Oxide with Bragg Coherent Diffractive Imaging

  ORAL

  March 14, 2022, 10:12 AM – March 14, 2022, 10:24 AM

  Publication: Imaging defects in vanadium(III) oxide nanocrystals using Bragg coherent diffractive imaging in CrystEngComm, 2021, 23, 6239-6244 https://doi.org/10.1039/D1CE00736J

  Presenters

  • Zachary J Barringer

    Rensselaer Polytechnic Institute

  Authors

  • Zachary J Barringer

    Rensselaer Polytechnic Institute

  • Jie Jiang

    Rensselaer Polytechnic Institute

  • Xiaowen Shi

    New Mexico State University, Lawrence Berkeley National Laboratory

  • Silvia Cipiccia

    Diamond Light Source

  • Jian Shi

    Rensselaer Polytechnic Institute

  • Edwin Fohtung

    Rensselaer Polytechnic Institute

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• Probing N- and Bi-related states in GaAsNBi/GaAs heterostructures

  ORAL

  March 14, 2022, 10:24 AM – March 14, 2022, 10:36 AM

  Publication: In preparation

  Presenters

  • Tao-Yu Huang

    University of Michigan

  Authors

  • Tao-Yu Huang

    University of Michigan

  • Jordan M Occena

    University of Michigan

  • Christian M Greenhill

    University of Michigan

  • Jack Hu

    Stanford University

  • Rachel S Goldman

    University of Michigan

  • Cagliyan Kurdak

    University of Michigan

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• Probing Non-Stoichiometry in GaAsBi and GaAsNBi Alloys Using Local-Electrode Atom Probe Tomography

  ORAL

  March 14, 2022, 10:36 AM – March 14, 2022, 10:48 AM

  Presenters

  • Jared W Mitchell

    University of Michigan

  Authors

  • Jared W Mitchell

    University of Michigan

  • Christian M Greenhill

    University of Michigan

  • Tao-Yu Huang

    University of Michigan

  • Kyle Hammond

    University of Michigan

  • Timothy Jen

    University of Michigan, Intel Corp.

  • Alexander Chang

    Northwestern University

  • Rachel S Goldman

    University of Michigan

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• Imaging reconfigurable molecular concentration on a graphene field-effect transistor

  ORAL

  March 14, 2022, 10:48 AM – March 14, 2022, 11:00 AM

  Publication: https://pubs.acs.org/doi/full/10.1021/acs.nanolett.1c03039

  Presenters

  • Hsin-Zon Tsai

    UC Berkeley

  Authors

  • Hsin-Zon Tsai

    UC Berkeley

  • Franklin Liou

    University of California, Berkeley

  • Andrew S Aikawa

    UC Berkeley

  • Kenji Watanabe

    National Institute for Materials Science, Tsukuba, Japan, National Institute for Materials Science, NIMS, Research Center for Functional Materials, National Institute for Materials Science, Tsukuba, Ibaraki 305-0044, Japan, Research Center for Functional Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan., Research Center for Functional Materials, National Institute for Materials Science, Advanced, Materials Laboratory, NIMS, 3 National Institute for Materials Science, Tsukuba, Japan, National Institute for Materials Science; 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan, National Institute of Materials Science, Tsukuba, Japan, National Institute of Materials Science, Advanced Materials Laboratory, National Institute for Materials Science, 1-1 Namiki, Tsukuba, 305-0044, Japan, National Institute for Materials Science (Japan), National Institute for Materials Science, Japan, Research Center for Functional Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan, Research Center for Functional Materials, Research Center for Functional Materials, National Institute for Materials Science, Tsukuba, Japan, Research Center for Functional Materials, National Institute for Materials Science, Japan, Research Center for Functional Materials, National Institute for Materials Science, 1-1Namiki, Tsukuba 305-0044, Japan, National Institute for Material Science, Japan, National Institute for Material Science, National Institute of Material Sciences, Japan, NIMS, Tsukuba, 2National Institute for Materials Science, Namiki 1-1, Ibaraki 305-0044, Japan., National Institute of Materials Science, Tsukuba, Ibaraki 305-0044, Japan, National Institute for Materials Science Japan, NIMS, Japan, nims, National Institute for Materials Science, Research Center for Functional Materials, Japan, National Institute for Materials Science Tsukuba, National Institute for Materials Science, 1-1 Namiki, National Institute for Materials Science of Japan, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan, NIMS - National Institute for Material Science, Japan, Research Center for Functional Materials, National Institute for Material Science, Tsukuba, Ibaraki, 305-0044, Japan., National Institute for Material Science, Tsukuba, National Institute for Materials Science, Tsukuba, Ibaraki 305-0044, Japan, National Institute for Materials Science (NIMS), National Institute for Materials Science, Research Center for Functional Materials, Research Center for Functional Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan, National Institute of Material Science, Kyoto Univ, National Institute for Materials Science,1-1 Namiki, Tsukuba, 305-0044, Japan

  • Takashi Taniguchi

    National Institute for Materials Science, Tsukuba, Japan, National Institute for Materials Science, NIMS, Kyoto Univ, International Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki, Ibaraki 305-0044, Japan., 3 National Institute for Materials Science, Tsukuba, Japan, National Institute for Materials Science; 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan, National Institute of Materials Science, Tsukuba, Japan, National Institute of Materials Science, Advanced Materials Laboratory, National Institute for Materials Science, 1-1 Namiki, Tsukuba, 305-0044, Japan, National Institute for Materials Science (Japan), International Center for Materials Nanoarchitectonics, National Institute for Materials Science, International Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan, Kyoto University, International Center for Materials Nanoarchitectonics, International Center for Materials Nanoarchitectonics, National Institute for Materials Science, Tsukuba, Japan, International Center for Materials Nanoarchitectonics, National Institute for Materials Science, Japan, International Center for Materials Nanoarchitectonics, National Institute for MaterialsScience, 1-1 Namiki, Tsukuba 305-0044, Japan, National Institute for Material Science, Japan, National Institute for Material Science, National Institute of Material Sciences, Japan, NIMS, Tsukuba, 2National Institute for Materials Science, Namiki 1-1, Ibaraki 305-0044, Japan., National Institute of Materials Science, Tsukuba, Ibaraki 305-0044, Japan, National Institute for Materials Science, Japan, International Center for Materials Nanoarchitectonics (WPI-MANA), National Institute for Materials Science, 1-1 Namiki Tsukuba, Ibaraki 305-0044, Japan., NIMS, Japan, National Institute for Materials Science (NIMS), NIMS. Japan, International Center for Material Nanoarchitectonics, National Institute for Materials Science, Tsukuba, Japan, International Center for Material Nanoarchitectonics, National Institute for Materials Science, National Institute for Materials Science Tsukuba, National Institute for Materials Science, 1-1 Namiki, National Institute for Materials Science of Japan, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan, NIMS - National Institute for Material Science, Japan, International Center for Materials Nanoarchitectonics, National Institute for Material Science, Tsukuba, Ibaraki 305-0044, Japan., National Institute for Material Science, Tsukuba, National Institute for Materials Science, International Center for Materials Nanoarchitectonics, International Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan, National Institute of Material Science, National Institute for Materials Science,1-1 Namiki, Tsukuba, 305-0044, Japan

  • Johannes C Lischner

    Imperial College London

  • Alex K Zettl

    University of California, Berkeley

  • Michael F Crommie

    University of California, Berkeley

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• An all optical approach for comprehensive in-operando analysis of radiative and nonradiative recombination processes - deep level optical spectroscopy

  ORAL

  March 14, 2022, 11:00 AM – March 14, 2022, 11:12 AM

  Presenters

  • Fan Zhang

    Univ of North Carolina - Charlotte

  Authors

  • Fan Zhang

    Univ of North Carolina - Charlotte

  • Jose F Castaneda

    Univ of North Carolina - Charlotte

  • Tim H Gfroerer

    Davidson College

  • Yong Zhang

    University of North Carolina at Charlott

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• Atomically Defined Wires on P-Type Silicon

  ORAL

  March 14, 2022, 11:12 AM – March 14, 2022, 11:24 AM

  Presenters

  • Furkan M Altincicek

    University of Alberta

  Authors

  • Furkan M Altincicek

    University of Alberta

  • Christopher Leon

    University of Alberta

  • Taras Chutora

    University of Alberta

  • Max Yuan

    University of Alberta

  • Roshan Achal

    University of Alberta

  • Jeremiah Croshaw

    University of Alberta

  • Lucian Livadaru

    Quantum Silicon, Inc.

  • Jason Pitters

    Nanotechnology Research Centre, National Research Council of Canada, Nanotechnology Research Center, National Research Council of Canada, Nanotechnology Research Centre, National Research Council Canada, Edmonton, Alberta T6G 2M9, Canada

  • Robert A Wolkow

    University of Alberta, Department of Physics, University of Alberta, Edmonton, Alberta T6G 2J1, Canada

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• Measurement of Si Surface Conduction by Two-probe Scanning Tunneling Microscopy with Ohmic Contact

  ORAL

  March 14, 2022, 11:24 AM – March 14, 2022, 11:36 AM

  Presenters

  • Ali Khademi

    Metrology Research Centre, National Research Council of Canada, 1200 Montreal Road, Ottawa, ON K1A 0R6, Canada

  Authors

  • Ali Khademi

    Metrology Research Centre, National Research Council of Canada, 1200 Montreal Road, Ottawa, ON K1A 0R6, Canada

  • Jo Onoda

    Department of Physics, University of Alberta, Edmonton, Alberta T6G 2J1, Canada

  • Robert A Wolkow

    University of Alberta, Department of Physics, University of Alberta, Edmonton, Alberta T6G 2J1, Canada

  • Jason Pitters

    Nanotechnology Research Centre, National Research Council of Canada, Nanotechnology Research Center, National Research Council of Canada, Nanotechnology Research Centre, National Research Council Canada, Edmonton, Alberta T6G 2M9, Canada

  View abstract →

• Charge state characterization of dangling bond circuitry on hydrogen passivated silicon

  ORAL

  March 14, 2022, 11:36 AM – March 14, 2022, 11:48 AM

  Presenters

  • Max Yuan

    University of Alberta

  Authors

  • Max Yuan

    University of Alberta

  • Roshan Achal

    University of Alberta

  • Taras Chutora

    University of Alberta

  • Furkan M Altincicek

    University of Alberta

  • Christopher Leon

    University of Alberta

  • Jeremiah Croshaw

    University of Alberta

  • Lucian Livadaru

    Quantum Silicon, Inc.

  • Jason Pitters

    Nanotechnology Research Centre, National Research Council of Canada, Nanotechnology Research Center, National Research Council of Canada, Nanotechnology Research Centre, National Research Council Canada, Edmonton, Alberta T6G 2M9, Canada

  • Robert A Wolkow

    University of Alberta, Department of Physics, University of Alberta, Edmonton, Alberta T6G 2J1, Canada

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• Atomic-scale study of Si-doped AlAs by cross-sectional scanning tunneling microscopy and density functional theory

  ORAL

  March 14, 2022, 11:48 AM – March 14, 2022, 12:00 PM

  Publication: https://doi.org/10.1103/PhysRevB.104.125433

  Presenters

  • Douwe Tjeertes

    Eindhoven University of Technology

  Authors

  • Douwe Tjeertes

    Eindhoven University of Technology

  • Paul M Koenraad

    Eindhoven University of Technology

  • Belita Koiller

    Federal University of Rio de Janeiro

  • Marcos Menezes

    Federal University of Rio de Janeiro

  • Adriana L Vela Pe?a

    Federal University of Rio de Janeiro

  View abstract →