Mitigation of dielectric loss in aluminium-based superconducting transmon qubits
ORAL
Abstract
Recent months have seen a jump in qubit coherence as a result of new materials exploration, surpassing the values that seemed to have reached a plateau in the traditional aluminium-based devices.
A pressing limitation of superconducting qubits is dielectric loss at surface interfaces caused by parasitic two-level systems. These two-level systems can reside at substrate-air, metal-air, or substrate-metal interfaces. However, these interfaces do not contribute equally to the overall dielectric loss. In this work we devise experiments to pinpoint the source of these losses, and show strategies to mitigate them.
We discuss various surface treatments and show the effect they have on qubit coherence, improving it beyond values usually observed in aluminium-based devices.
A pressing limitation of superconducting qubits is dielectric loss at surface interfaces caused by parasitic two-level systems. These two-level systems can reside at substrate-air, metal-air, or substrate-metal interfaces. However, these interfaces do not contribute equally to the overall dielectric loss. In this work we devise experiments to pinpoint the source of these losses, and show strategies to mitigate them.
We discuss various surface treatments and show the effect they have on qubit coherence, improving it beyond values usually observed in aluminium-based devices.
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Presenters
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Janka Biznarova
Chalmers Univ of Tech, Chalmers University of Technology
Authors
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Janka Biznarova
Chalmers Univ of Tech, Chalmers University of Technology
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Marcus Rommel
Chalmers University of Technology, Chalmers Univ of Tech
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Amr Osman
Chalmers Univ of Tech, Chalmers University of Technology
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Andreas Nylander
Chalmers University of Technology, Chalmers Univ of Tech
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Christopher W Warren
Chalmers Univ of Tech, Chalmers University of Technology
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Sandoko Kosen
Chalmers Univ of Tech, Chalmers University of Technology
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Anita F Fadavi Roudsari
Chalmers University of Technology, Chalmers Univ of Tech
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Jonas Bylander
Chalmers Univ of Tech, Chalmers University of Technology