Heat leaks and noise in microkelvin electronics on a pulse-tube cryostat
ORAL
Abstract
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Publication: Samani, Scheller et al. arXiv:2110.06293 (2021)
Presenters
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Omid S Sharifi Sedeh
University of Basel
Authors
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Mohammad Samani
University of Basel
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Christian P Scheller
University of Basel
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Nikolai Yurttagül
VTT
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Kestutis Grigoras
VTT Technical Research Centre of Finland Ltd, P.O. Box 1000, FI-02044 VTT Espoo, Finland, VTT
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David Gunnarsson
VTT Technical Research Centre of Finland Ltd, P.O. Box 1000, FI-02044 VTT Espoo, Finland, VTT
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Omid S Sharifi Sedeh
University of Basel
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Alexander T Jones
Department of Physics, Lancaster University, Bailrigg, Lancaster LA1 4YB, UK, Lancaster University
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Jonathan R Prance
Lancaster Univ
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Richard Haley
Lancaster University, Department of Physics, Lancaster University, Bailrigg, Lancaster LA1 4YB, UK
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Mika Prunnila
VTT Technical Research Centre of Finland Ltd, P.O. Box 1000, FI-02044 VTT, Espoo, Finland, VTT Nano and Microelectronics, VTT Micro & Nanoelectronics, VTT Technical Research Centre of Finland Ltd, P.O. Box 1000, FI-02044 VTT Espoo, Finland, VTT
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Dominik M Zumbuhl
University of Basel