Reverse modelling for Lorentz transmission electron microscopy
ORAL
Abstract
Lorentz Transmission Electron Microscopy (LTEM) is a versatile measurement technique that can probe the magnetic configuration of thin films under a wide variety of experimental conditions. One limitation of this measurement technique is that it is only sensitive to projection of the sample’s magnetic moment onto a two dimensional plane that is perpendicular to an electron beam which is passed through the sample. We have developed an algorithm which linearizes the relationship between the experimental sample and measured phase change. The resulting underdetermined system can be augmented by solving to two or more different measurements simultaneously and can be solved using iterative optimizers. We apply this to measurements of NdFeB to obtain a magnetic configuration which would not be discoverable by treating measurements individually.
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Presenters
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William Perry
Department of Physics and the Quantum Theory Project, University of Florida
Authors
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William Perry
Department of Physics and the Quantum Theory Project, University of Florida
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Min He
Institute of Physics, Chinese Academy of Sciences
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Ying Zhang
Institute of Physics, Chinese Academy of Sciences
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Xiaoguang Zhang
Department of Physics and the Quantum Theory Project, University of Florida, University of Florida, Department of Physics, Center for Molecular Magnetic Quantum Materials and Quantum Theory Project, University of Florida, Department of Physics, University of Florida, Department of Physics and the Quantum Theory Project, University of Florida, Gainesville, FL, Physics, University of Florida