Correlative Raman Imaging: See the complete picture

Raman imaging microscopy characterizes materials by the unique “fingerprint” revealed when their molecular bonds scatter light. Confocal Raman systems are able to generate high resolution 3D images. Our presentation will explore the technique’s potential for semiconductor development, 2D materials investigation, battery research and many other challenges. When combined with other methods such as atomic force microscopy (AFM), photoluminescence (PL), second and third-harmonic generation (SHG, THG) or scanning electron microscopy (SEM), it is known as correlative Raman imaging. This hybrid approach delivers a more comprehensive understanding of a sample by acquiring chemical and structural information from the same measurement position. Application examples provided will focus on surface characterization and materials research. The non-destructive, label-free and convenient nature of Raman microscopy will be emphasized, showing how samples can be rapidly investigated without specialized preparation. Intuitive software routines for post-processing and data evaluation will also be described, along with the advantages of tools such as topographic Raman imaging (TrueSurface) and automated microparticle analysis (ParticleScout).