Spectrophotometry detection of Color centers within MoS₂ ultrathin film samples

Molybdenite as a semiconducting material has interesting properties both optically and electronically in 2D morphology, make it a suitable candidate for (opto) electronic applications. Ultrathin films of MoS₂ grown on sapphire were investigated for possible detection of color centers. Due to fabrication process of our samples (which based on sulfurization of MoO₃ ultrathin films grown on sapphire within tube furnace), many void defects contained within them. Optical micrograph of our sample proves the nonhomogeneous nature of the grown film, while absorption spectra confirms the ultrathin formation of layer on sapphire observing excitonic peaks at 1.85 & 2 eV. Minor absorption peaks observed at 1.12 & 1.62 eV (FHWM=0.2 eV) through spectrophotometry and through FTIR spectroscopy. These absorptions attributed to the void/color centers within the samples. We plan to present our findings through a talk at coming APS March meeting.