STM/S study of surface reconstruction and atomic defects on iron-based superconductors
ORAL
Abstract
Surface reconstruction and defects can dramatically modify the properties of iron-based superconductors. Here, we systematically investigated the surface of low-temperature cleaved parent and doped BaFe2As2 superconductors by scanning tunneling microscopy/spectroscopy (STM/S). STM imaging reveals the emergency of a new reconstruction while increasing the temperature from 77K to 165K. The structural and electronic properties of this new surface reconstruction was investigated. We have also induced atomic defects on the surface by tip scanning and the electronic property of those tip-induced defects showed similarity with the reconstructed surface.
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Presenters
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Zhuozhi Ge
Oak Ridge National Lab
Authors
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Zhuozhi Ge
Oak Ridge National Lab
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Qiang Zou
Oak Ridge National Lab
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Mingming Fu
Oak Ridge National Lab
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Liurukara D Sanjeewa
Oak Ridge National Lab
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Athena S. Sefat
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge National Lab
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Zheng Gai
Oak Ridge National Laboratory, Oak Ridge National Lab