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Measurement of the out-of-plane g-factor in strained Ge/SiGe using single-hole quantum dots

ORAL

Abstract

Lithographically patterned quantum dots in strained Ge/SiGe have become promising candidates for quantum computing, with a quick progression to qubit logic demonstrations. Here we present an experimental measurement of the out-of-plane g-factor in this material for a single hole confined to a quantum dot, which avoids the strong orbital effects that can occur in this configuration. Strong asymmetry of the g-factor between the in- and out-of-plane directions is seen. These results are in agreement with calculations using the Luttinger Hamiltonian and suggest dramatic tunability through both the B-field and the charge state.

Presenters

  • Andrew J Miller

    Sandia National Laboratories

Authors

  • Andrew J Miller

    Sandia National Laboratories

  • Mitchell Brickson

    Sandia National Laboratories

  • Will J Hardy

    Sandia National Laboratories

  • Chia-You Liu

    National Taiwan University

  • Jiun-Yun Li

    National Taiwan University, Department of Electrical Engineering and Graduate Institute of Electronic Engineering, National Taiwan University

  • Andrew D Baczewski

    Sandia National Laboratories

  • Michael P Lilly

    Sandia National Laboratories, Sandia National Laboratories, Center for Integrated Nanotechnologies, Center for Integrated Nanotechnologies, Sandia National Laboratories

  • Tzu-Ming Lu

    Sandia National Laboratories, Sandia National Laboratories, Center for Integrated Nanotechnologies, Center for Integrated Nanotechnologies, Sandia National Laboratories

  • Dwight R Luhman

    Sandia National Laboratories