Electronic structure of epitaxially strained Sr<sub>2</sub>CrReO<sub>6</sub>
ORAL
Abstract
To characterize orbital ordering, synchrotron x-ray scattering is measured for three strain states of SCRO thin films, compressive (-1%) on a (LaAlO3)0.3(Sr2AlTaO6)0.7 (LSAT) substrate, tensile (+1%) on a relaxed SrCr0.5Nb0.5O3 buffer layer on LSAT, and relaxed on SrTiO3 (STO) substrate. The normally forbidden half-order diffraction peak ((1 1 0.5) in the pseudocubic system) is observed for the unstrained film grown on SrTiO3, but not for the strained films, which may indicate orbital ordering in the unstrained film. These results will be discussed in light of resonant inelastic x-ray scattering (RIXS) experimental data and calculations.
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Presenters
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Guillaume Marcaud
Yale University
Authors
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Guillaume Marcaud
Yale University
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Alex Lee
Yale University
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Adam Joseph Hauser
University of Alabama
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Fengyuan Yang
Ohio State Univ - Columbus, Deparment of Physics, The Ohio State University, Department of Physics, The Ohio State University, Physics, The Ohio State University, Department of Physics, Ohio State University, The Ohio State University, Physics, Ohio State University, Physics Department, The Ohio State University, Columbus, Ohio 43210
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Sangjae Lee
Yale University
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Diego M Casa
Argonne National Lab, Argonne National Laboratory
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Mary Upton
Argonne National Laboratory, Argonne National Lab
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Thomas Gog
Argonne National Laboratory
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yilin Wang yilinwang@bnl.gov
Brookhaven National Laboratory
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Mark Dean mpmdean@gmail.com
Brookhaven National Laboratory
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Hua Zhou
X-ray Science Division, Advanced Photon Source,, Argonne National Laboratory, Advanced Photon Source, Argonne National Laboratory, Advanced Photon Source, Argonne National Laboratory, Lemont, IL, 60439, USA, Argonne National Laboratory, Advanced Photon Source, Argonne National Lab, Advanced Photon Source
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Frederick Walker
Yale University
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Ignace Jarrige
Brookhaven National Laboratory, National Synchrotron Light Source II, Brookhaven National Laboratory, NSLS-II, Brookhaven National Laboratory
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Sohrab Ismail-Beigi
Department of Mechanical Engineering & Materials Science, Yale University, Yale University
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Charles Ahn
Yale University