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Developments in Reflectivity for Thin Film Characterization

FOCUS · E02 · ID: 380808

Presentations

  • Solvent vapor annealing of diblock copolymer thin films with a solvent mixture

    Invited

    –

    Presenters

    • Christine Papadakis

      Technical University of Munich, TU Munich

    Authors

    • Christine Papadakis

      Technical University of Munich, TU Munich

    • Florian A. Jung

      TU Munich

    • Anatoly V. Berezkin

      TU Munich

    • Dorthe Posselt

      IMFUFA, Fepartment of Science and the Environment, Roskilde University

    • Detlef M Smilgies

      Cornell High Energy Synchrotron Source (CHESS), Wilson Laboratory, Cornell University

    View abstract →

  • Introducing the CANDOR polychromatic reflectometer

    ORAL

    –

    Presenters

    • David Hoogerheide

      National Institute of Standards and Technology

    Authors

    • David Hoogerheide

      National Institute of Standards and Technology

    • Alexander Grutter

      National Institute of Standards and Technology, Center for Neutron Research, National Institute of Standards and Technology, NIST Center for Neutron Research, NIST, NIST Gaithersburg

    • Brian Maranville

      National Institute of Standards and Technology

    • Charles Majkrzak

      National Institute of Standards and Technology

    View abstract →

  • Characterization of anisotropic organic layered films by resonant soft x-ray reflectivity

    ORAL

    –

    Presenters

    • Luca Pasquali

      Università di Modena e Reggio Emilia, University of Modena & Reggio Emilia

    Authors

    • Luca Pasquali

      Università di Modena e Reggio Emilia, University of Modena & Reggio Emilia

    • Raffaella Capelli

      University of Modena & Reggio Emilia

    • Matteo Bonfatti

      University of Modena & Reggio Emilia

    • Francesco Mezzadri

      University of Modena & Reggio Emilia

    • Emanuele Galligani

      University of Modena & Reggio Emilia

    • Adriano Verna

      University of Roma Tre

    • Alessandro Ruocco

      University of Roma Tre

    • Nicola Mahne

      CNR-IOM

    • Stefano Nannarone

      CNR-IOM

    View abstract →

  • Probing Buried Interfaces in Polymers with Soft X-ray Reflectivity

    ORAL

    –

    Presenters

    • Daniel Sunday

      National Institute of Standards and Technology, National Institute for Standards and Technology

    Authors

    • Daniel Sunday

      National Institute of Standards and Technology, National Institute for Standards and Technology

    • Jacob L Thelen

      National Institute of Standards and Technology

    • Chun Zhou

      Institute for Molecular Engineering, University of Chicago

    • Jiaxing Ren

      Institute for Molecular Engineering, University of Chicago

    • R. Joseph Kline

      National Institute of Standards and Technology

    • Paul F Nealey

      Molecular Engineering, University of Chicago, Pritzker School of Molecular Engineering, University of Chicago, University of Chicago, Institute for Molecular Engineering, University of Chicago

    View abstract →

  • Development of spin-contrast-variation neutron reflectometry for structural analysis of multilayer films

    ORAL

    –

    Presenters

    • Takayuki Kumada

      Japan Atomic Energy Agency

    Authors

    • Takayuki Kumada

      Japan Atomic Energy Agency

    • Kazuhiro Akutsu

      Neutron Science and Technology Center, Comprehensive Research Organization for Science and Society

    • Daisuke Miura

      Department of Physics, Yamagata University

    • Jun-ichi Suzuki

      Neutron Science and Technology Center, Comprehensive Research Organization for Science and Society

    • Naoya Torikai

      Graduate School of Engineering, Mie University

    View abstract →

  • Determining Lamellar Structure with Soft X-ray Reflectivity

    ORAL

    –

    Presenters

    • Whitney Loo

      University of California, Berkeley, University of Chicago, Chemical and Biomolecular Engineering, University of California, Berkeley

    Authors

    • Whitney Loo

      University of California, Berkeley, University of Chicago, Chemical and Biomolecular Engineering, University of California, Berkeley

    • Hongbo Feng

      Molecular Engineering, University of Chicago, University of Chicago

    • Daniel Sunday

      National Institute of Standards and Technology, National Institute for Standards and Technology

    • Paul F Nealey

      Molecular Engineering, University of Chicago, Pritzker School of Molecular Engineering, University of Chicago, University of Chicago, Institute for Molecular Engineering, University of Chicago

    View abstract →

  • Depth profiling molecular orientation with polarized resonant soft X-ray reflectivity

    ORAL

    –

    Presenters

    • Thomas Ferron

      National Institute of Standards and Technology, Physics and Astronomy, Washington State University, Washington State Univ

    Authors

    • Thomas Ferron

      National Institute of Standards and Technology, Physics and Astronomy, Washington State University, Washington State Univ

    • Jacob L Thelen

      National Institute of Standards and Technology

    • Kushal Bagchi

      University of Wisconsin - Madison, Department of Chemistry, University of Wisconsin-Madison

    • Marie Fiori

      University of Wisconsin - Madison

    • Mark Ediger

      University of Wisconsin - Madison, Department of Chemistry, University of Wisconsin-Madison

    • Dean DeLongchamp

      National Institute of Standards and Technology

    • Daniel Sunday

      National Institute of Standards and Technology, National Institute for Standards and Technology

    View abstract →