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Nanoscale Characterization of Correlated and Entangled Quantum Phenomena

INVITED · B58 · ID: 381942






Presentations

  • Revealing topological surface states with STM-based spectroscopy

    Invited

    Presenters

    • An-Ping Li

      Oak Ridge National Laboratory, Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge National Lab

    Authors

    • An-Ping Li

      Oak Ridge National Laboratory, Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge National Lab

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  • From Atoms to Transistors

    Invited

    Presenters

    • Shashank Misra

      Sandia National Laboratories

    Authors

    • Shashank Misra

      Sandia National Laboratories

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  • Toward practical quantum-enhanced microscopies

    Invited

    Presenters

    • Benjamin Lawrie

      ORNL, Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge National Lab

    Authors

    • Benjamin Lawrie

      ORNL, Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge National Lab

    • Raphael Pooser

      Oak Ridge National Laboratory, Oak Ridge National Lab

    • Vasudevan Iyer

      Oak Ridge National Lab

    View abstract →