Optimal Boron Thickness in a NISC
ORAL
Abstract
A neutron intercepting silicon chip (NISC) comprises a silicon data storage chip coated with a layer of borophosphosilicate glass (BPSG) containing boron-10. Neutrons interact in the boron layer via neutron capture: n + B-10 -> Li-7 + He-4. The ions produced deposit charge (on the order of fC/um) over a range of several microns; when one of them passes through the data-storing oxide-nitride-oxide (ONO) layer of the chip, the charge it deposits causes a leakage across capacitors in the chip, and as a result bits flip from positive to negative. In the interests of optimizing the thickness of the boron layer, a Monte Carlo program has been written to simulate the paths of particles and their charge deposits in the charge-storing layer. The simulation shows that a significant advantage in efficiency can likely be gained by increasing the thickness of the boron layer by an order of magnitude.
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Presenters
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John Rabaey
University of Dallas
Authors
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John Rabaey
University of Dallas
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Steven Block
University of Dallas
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Will H Flanagan
University of Dallas
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Clayton Fullwood
Cerium Labs, Cerium labs
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Peter Hedlesky
University of Dallas
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Tim Hossain
Cerium Labs, Cerium labs
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Aidan Medcalf
University of Dallas
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Mark Clopton
Cerium Labs, Cerium labs
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Tracy Tipping
Cerium Labs, Nuclear and Radiation Engineering, University of Texas at Austin
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Peter Niles
University of Dallas