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X-ray nanoprobe strain measurements for diamond-based quantum sensing

ORAL

Abstract

Point defects in diamond are a popular, growing platform for quantum sensing and information. Nanoscale strain is a crucial challenge for many such applications, including high-resolution magnetometry and quantum information processing with fabricated optical devices. Additionally, measuring nanoscale strain is central to a proposed diamond-based technique for directional detection of dark matter. Scanning Bragg diffraction allows three-dimensional measurements of strain at the nanoscale. We discuss the application of this technique to lab-grown diamonds, including measurements of growth-defect-induced strain in a diamond optimized for magnetic sensing and background characterization measurements for a proposed dark matter detector.

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Presenters

  • Mason Marshall

    University of Maryland, College Park

Authors

  • Mason Marshall

    University of Maryland, College Park

  • David F Phillips

    Harvard-Smithsonian Center for Astrophysics

  • Matthew J Turner

    Quantum Technology Center, University of Maryland, University of Maryland, College Park

  • Mark Ku

    Physics and Astronomy & Materials Science and Engineering, University of Delaware, University of Delaware

  • Tao Zhou

    Argonne National Lab

  • Nazar Delegan

    Argonne National Lab, Center for Molecular Engineering and Materials Science Division, Argonne National Laboratory

  • F. Joseph

    Argonne National Lab, Center for Molecular Engineering and Materials Science Division, Argonne National Laboratory, Argonne National Laboratory, Center for Molecular Engineering and Materials Science Division, Center for Molecular Engineering, Materials Science Division, Argonne National Laboratory

  • Martin Holt

    Center for nanoscale materials, Argonne National Laboratory, Argonne National Laboratory, Argonne National Lab

  • Ronald L Walsworth

    Quantum Technology Center, University of Maryland, University of Maryland, College Park