Atomic resolution characterization of 2D materials with scanning transmission electron microscopy.
Invited
Abstract
Selected by Focus Topic Organizer (Liuyan Zhao, Robert Hovden).
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Presenters
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Nasim Alem
Department of Materials Science and Engineering, Pennsylvania State University, Materials Science and Engineering, Penn State University
Authors
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Nasim Alem
Department of Materials Science and Engineering, Pennsylvania State University, Materials Science and Engineering, Penn State University