Imaging double moiré pattern in twisted bilayer graphene grown on hBN with microwave impedance microscopy
ORAL
Abstract
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Presenters
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Xiong Huang
University of California, Riverside
Authors
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Xiong Huang
University of California, Riverside
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Lingxiu Chen
Shanghai Institute of Microsystem and Information Technology Chinese Academy of Sciences
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Shujie Tang
Standford, Stanford University, Stanford Univeristy, Geballe Laboratory for Advanced Materials, Stanford University
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Chengxin Jiang
Shanghai Institute of Microsystem and Information Technology Chinese Academy of Sciences
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Chen Chen
Shanghai Institute of Microsystem and Information Technology Chinese Academy of Sciences
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Huishan Wang
Shanghai Institute of Microsystem and Information Technology Chinese Academy of Sciences
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Zhixun Shen
Standford, Stanford University, Stanford Univeristy, Applied Physics, Stanford University, SLAC National Accelerator Laboratory, Geballe Laboratory for Advanced Materials, Department of Applied Physics, Stanford University, Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo Park, CA 94025, USA, Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, SIMES, SLAC - Natl Accelerator Lab, Stanford Univ
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Haomin Wang
Shanghai Institute of Microsystem and Information Technology Chinese Academy of Sciences
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Yongtao Cui
University of California, Riverside, University of California, Reverside