2D Semiconductor Transistors using Layered van der Waals Oxide MoO<sub>3</sub> as High-<i>K</i> Gate Dielectric
ORAL
Abstract
The search for smaller field effect transistors is leading research towards atomically thin 2D semiconductor materials. Due to the decreasing size of these transistors, there must be an emphasis on finding compatible gate dielectrics that can be equally effective in the 2D regime. MoO3 is an attractive multi-functional transition metal oxide replacement for gate dielectrics in field effect transistors due to its exfoliatable van der Waals structure in addition to its high dielectric constant. This study demonstrates that as-grown MoO3 has a high dielectric constant, K, of approximately 35 at room temperature at low frequencies by fabricating parallel plate capacitors from these thin flakes. Mechanically exfoliated MoO3 flakes are used to create 2D heterostructures with WSe2, demonstrating that MoO3 also induces holes in the WSe2 layer. Most importantly, MoO3 proves to be a strong gate dielectric when used as a top-gate material for WSe2 heterostructure devices.
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Presenters
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Brian Holler
Case Western Reserve University
Authors
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Brian Holler
Case Western Reserve University
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Kyle Crowley
Case Western Reserve University
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Halyna Volkova
MINES Paris Tech, Centre des matériaux, MINES ParisTech
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Marie-Helene Berger
MINES Paris Tech, Centre des matériaux, MINES ParisTech
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Xuan Gao
Case Western Reserve University