Single shot metrology of shocked dynamic parameters for transparent materials

Laser-driven shock compression is a common method to study the equations of states (EOS) of materials under extreme conditions. The shock etalon method is an effective method to extract the shocked dynamic parameters of transparent materials. However, the sample surface reflection should be eliminated when using this method, which results in more time and efforts on the sample preparation.
Here, we proposed a modified shock etalon method to measure the shocked dynamic parameters of transparent materials. The proposed method utilizes the p-polarized chirped probe pulse under the Brewster incident angle to eliminate the sample surface reflection, thus no extra efforts on the sample preparation are needed and can adapt the simplest solid transparent thin film samples. Simulation results show that the proposed method is feasible, accurate and robust on the shocked dynamics metrology for solid transparent materials. At last, the shock compression experiment with the proposed method is carried out on a polycarbonate thin film and the shocked dynamic parameters are obtained successfully, such as the shock velocity, the particle velocity and the shocked refractive index.

[1]. M. R. Armstrong, J. C. Crowhurst, S. Bastea, and J. M. Zaug, J. Appl. Phys. 108, 023511 (2010).