APS Logo

Efficient bias-driven magnetization control by orbital selection at a La<sub>0.67</sub>Sr<sub>0.33</sub>MnO<sub>3</sub> interface

Invited

Abstract

Bias-driven magnetization control of a ferromagnet, which utilizes the ability of controlling the magnetic anisotropy (MA) with an electric field, is crucial for spintronic applications due to its low power consumption. However, it remains a challenge to induce a large change in the MA of ferromagnetic materials that can rotate the magnetization. In this work, using La0.67Sr0.33MnO3 (LSMO)/SrTiO3 (STO)/LSMO magnetic tunnel junctions (MTJs), we demonstrate that a drastic change in the MA of LSMO can be induced when the chemical potential (EF) at the LSMO/STO interface is moved between bands with different orbital symmetries. By this new approach, we successfully realize a deterministic and magnetic-field-free 90°-magnetization switching of LSMO solely by applying a small electric field of 0.05 V/nm on the tunnel barrier, with a negligibly small current density of ~ 10–2 A/cm2.
The studied MTJs are grown on an STO (001) substrate by molecular beam epitaxy. We probe the orbital symmetry of the carriers and the MA of the LSMO layers at each bias V by measuring the magnetic-field-direction dependence of the tunneling conductance and that of the tunneling magnetoresistance (TMR), respectively. Using this approach, we show that, with applying V, the MA of the LSMO switches from a two-fold symmetry to a four-fold symmetry by shifting EF from the eg band to the t2g band [1]. This change of MA is strong enough to rotate the magnetization direction from [110] to [1-10] without any assisting magnetic field. Our findings indicate that highly efficient magnetization control can be realized by designing materials so that the EF lies close to the band edges of different-symmetry orbitals [2].
[1] L. D. Anh et al., Sci. Rep. 7, 8715 (2017). [2] L. D. Anh et al., Phys. Rev. Applied. 12, 041001 (2019).

Presenters

  • Le Duc Anh

    Univ of Tokyo, Department of Electrical Engineering and Information Systems, The University of Tokyo, Institute of Engineering Innovation, The University of Tokyo

Authors

  • Le Duc Anh

    Univ of Tokyo, Department of Electrical Engineering and Information Systems, The University of Tokyo, Institute of Engineering Innovation, The University of Tokyo

  • Takashi Yamashita

    Univ of Tokyo

  • Noboru Okamoto

    Univ of Tokyo

  • Hiroki Yamasaki

    Univ of Tokyo

  • Daisei Araki

    Univ of Tokyo, Department of Electrical Engineering and Information Systems, The University of Tokyo

  • Munetoshi Seki

    Univ of Tokyo, Department of Electrical Engineering and Information Systems, The University of Tokyo

  • Hitoshi Tabata

    Univ of Tokyo, Department of Electrical Engineering and Information Systems, The University of Tokyo

  • Masaaki Tanaka

    Univ of Tokyo, Department of Electrical Engineering and Information Systems, The University of Tokyo

  • Shinobu Ohya

    Univ of Tokyo, Department of Electrical Engineering and Information Systems, The University of Tokyo, Institute of Engineering Innovation, The University of Tokyo