Native defects in Antiferromagnetic Topological Insulator MnBi<sub>2</sub>Te<sub>4</sub>
ORAL
Abstract
1. Otrokov, M. M. et al. Phys. Rev. Lett. 122, 107202 (2019).
2. Gong, Y. et al. Chin. Phys. Lett. 36, 076801 (2019).
3. Yan, J.-Q. et al. Phys. Rev. Mater. 3, 064202 (2019)
4. Yan, J.-Q. et al. arXiv:1905.00400 (2019).
5. Sass, P. M. et al. arXiv:1910.06488 (2019).
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Presenters
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Zengle Huang
Department of Physics and Astronomy, Rutgers University, New Brunswick, Department of Physics and Astronomy, Rutgers University
Authors
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Zengle Huang
Department of Physics and Astronomy, Rutgers University, New Brunswick, Department of Physics and Astronomy, Rutgers University
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Jiaqiang Yan
Materials Science and Engineering, The University of Tennessee, Oak Ridge National Lab, Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge National Lab, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
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Weida Wu
Physics and Astronomy, Rutgers University, New Brunswick, Department of Physics and Astronomy, Rutgers University, Department of Physics and Astronomy, Rutgers, The State University of New Jersey, Department of Physics and Astronomy, Rutgers University, New Brunswick, Rutgers University, New Brunswick