Imaging domains and defects in the stacking of few-layer and twisted CrI<sub>3</sub>
ORAL
Abstract
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Presenters
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Ariana Ray
School of Applied and Engineering Physics, Cornell University, Physics, Cornell University
Authors
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Ariana Ray
School of Applied and Engineering Physics, Cornell University, Physics, Cornell University
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Yu-Tsun Shao
Applied and Engineering Physics, Cornell University
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Yang Xu
Purdue University, Cornell University, NY, USA, Applied and Engineering Physics, Cornell University, Cornell University
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Nikhil Sivadas
Applied and Engineering Physics, Cornell University
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Tingxin Li
Applied and Engineering Physics, Cornell University, Cornell University
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Zefang Wang
Cornell University, Applied and Engineering Physics, Cornell University
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Jie Shan
Cornell University, School of Applied and Engineering Physics and Department of Physics, Cornell University, Cornell University, NY, USA, Physics, Cornell University, Case Western Reserve University
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Kin Fai Mak
Cornell University, School of Applied and Engineering Physics, Cornell University, Cornell University, NY, USA, Applied and Engineering Physics, Cornell University
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David Anthony Muller
Cornell University, School of Applied and Engineering Physics, Cornell University, Applied and Engineering Physics, Cornell University, School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853, USA