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Microwave loss of van der Waals dielectrics in the low-temperature, single-photon regime

ORAL

Abstract

Microwave dielectric loss – due to interaction between the electromagnetic field and spurious two-level-systems (TLS) – constitutes one of the main sources of decoherence in superconducting quantum circuits. Researches have shown the loss occurs in the bulk of dielectrics as well as of the many interfaces of circuit elements.

Hexagonal boron nitride (hBN), an insulating 2-D(van der Waals) material that features an essentially defect-free bulk and atomically flat surfaces through mechanical exfoliation, may be used to build high-quality Josephson elements and qubit capacitors. We study hBN in the microwave regime via lateral capacitive coupling and parallel plate capacitors. In the single-photon limit, the extracted quality factor of hBN is bounded below at ~ 200,000. Beyond hBN, this measurement technique can also be used to explore new material platforms for superconducting technologies.

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Presenters

  • Joel Wang

    Research Laboratory of Electronics, Massachusetts Institute of Technology, Research Laboratory of Electronics, Massachusetts Institute of Technology MIT, Physics, MIT, Research Laboratory of Electronics, Massachusetts Institute of Technology (MIT)

Authors

  • Joel Wang

    Research Laboratory of Electronics, Massachusetts Institute of Technology, Research Laboratory of Electronics, Massachusetts Institute of Technology MIT, Physics, MIT, Research Laboratory of Electronics, Massachusetts Institute of Technology (MIT)

  • Megan Yamoah

    Department of Physics, Massachusetts Institute of Technology (MIT), Department of Physics, Massachusetts Institute of Technology

  • Qing Li

    MIT, Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology (MIT), Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology

  • Charlotte Boettcher

    Harvard University, Department of Physics, Harvard University

  • Bharath Kannan

    Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Research Laboratory of Electronics, Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology (MIT)

  • David K Kim

    MIT Lincoln Laboratory, MIT Lincoln Lab, MIT-Lincoln Lab, MIT Lincoln Laboratories, Lincoln Laboratory, Massachusetts Institute of Technology (MIT), Massachusetts Institute of Technology (MIT) Lincoln Laboratory

  • Jonilyn Yoder

    MIT Lincoln Laboratory, MIT-Lincoln Lab, Lincoln Laboratory, Massachusetts Institute of Technology (MIT), MIT Lincoln Lab

  • Kenji Watanabe

    National Institute for Materials Science, Japan, National Institute for Material Science, National Institute for Materials Science, National Institute for Materials Science, Tsukuba, Research Center for Functional Materials, NIMS, nims, Advanced Materials Laboratory, National Institute for Materials Science, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan, NIMS, National Institute for Material Science - Japan, NIMS Tsukuba, National Institute for Materials Science, Namiki 1-1, Ibaraki 305-0044, Japan., National Institute for Materials Science (NIMS), National Institute for Materials Science,Tsukuba, Ibaraki 305-0047, Japan, Advanced Materials Laboratory, NIMS, Japan, National Institute for Materials Science,1-1 Namiki, Tsukuba, 305-0044, Japan, National Institute of Materials Science, National Institute for Materials Science, University of Tsukuba, National Institute for Materials Science, Tsukuba, Japan, National Institute for Material Science, Japan, National Institue for Material Science, Tsukuba, Advanced Materials Laboratory, NIMS, Advanced Materials Laboratory, National Institute for Materials Science, Tsukuba 305-0044, Japan, Advanced Matrials Lab, NIMS, National Institute for Material Science, Tsukuba, Japan, National institute for materials science, NIMS-Tsukuba, NIMS, Japan, National Institute for Materials Science, Namiki Tsukuba Ibaraki, Japan, NIRM, Advanced Materials Laboratory, National Institute for Materials Science, Tsukuba, Japan, NIMS Japan, National Institute for Materials Science, Tsukuba, Ibaraki 305-0044, Japan, Research Center for Functional Materials, National Institute for Materials Science, Tsukuba, Ibaraki, Japan, Advanced Materials Laboratory, National Institute of Materials Science, Advanced Materials Laboratory, National Institute for Materials Science 1-1 Namiki, Tsukuba, 305-0044, Japan, National Institute of Material Science, 1-1 Namiki, Tsukuba 305-0044, Japan, National Institute for Material Science (Japan), Physics, NIMS, National Institute of Materials Science, Japan, National Institute of Materials Science (NIMS), National Institute of Materials Science, Tsukuba, Ibaraki 305-0044, Japan, NIMS - Tsukuba

  • Takashi Taniguchi

    National Institute for Materials Science, Japan, National Institute for Material Science, National Institute for Materials Science, National Institute for Materials Science, Tsukuba, Research Center for Functional Materials, NIMS, nims, Advanced Materials Laboratory, National Institute for Materials Science, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan, NIMS, National Institute for Material Science - Japan, NIMS Tsukuba, National Institute for Materials Science, Namiki 1-1, Ibaraki 305-0044, Japan., National Institute for Materials Science (NIMS), National Institute for Materials Science,Tsukuba, Ibaraki 305-0047, Japan, Advanced Materials Laboratory, NIMS, Japan, National Institute for Materials Science,1-1 Namiki, Tsukuba, 305-0044, Japan, National Institute of Materials Science, National Institute for Materials Science, University of Tsukuba, National Institute for Materials Science, Tsukuba, Japan, National Institue for Material Science, Tsukuba, Advanced Materials Laboratory, NIMS, Advanced Materials Laboratory, National Institute for Materials Science, Tsukuba 305-0044, Japan, Advanced Matrials Lab, NIMS, National Institute for Material Science, Tsukuba, Japan, National institute for materials science, NIMS-Tsukuba, NIMS, Japan, National Institute for Materials Science, Namiki Tsukuba Ibaraki, Japan, Advanced Materials Laboratory, National Institute for Materials Science, Tsukuba, Japan, NIMS Japan, National Institute for Materials Science, Tsukuba, Ibaraki 305-0044, Japan, Research Center for Functional Materials, National Institute for Materials Science, Tsukuba, Ibaraki, Japan, Advanced Materials Laboratory, National Institute of Materials Science, Advanced Materials Laboratory, National Institute for Materials Science 1-1 Namiki, Tsukuba, 305-0044, Japan, National Institute of Material Science, 1-1 Namiki, Tsukuba 305-0044, Japan, National Institute for Material Science (Japan), Physics, NIMS, National Institute of Materials Science, Japan, National Institute of Materials Science, Tsukuba, Ibaraki 305-0044, Japan, NIMS - Tsukuba

  • Terry Philip Orlando

    Electrical Engineering and Computer Science, Research Laboratory of Electronics, Massachusetts Institute of Technology, Research Laboratory of Electronics, Massachusetts Institute of Technology MIT, Massachusetts Institute of Technology MIT, Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Research Laboratory of Electronics, Massachusetts Institute of Technology, Massachusetts Institute of Technology, MIT Lincoln Laboratory, Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology (MIT)

  • Simon Gustavsson

    Research Laboratory of Electronics, Massachusetts Institute of Technology, Research Laboratory of Electronics, Massachusetts Institute of Technology MIT, Massachusetts Institute of Technology MIT, Massachusetts Institute of Technology, Research Laboratory of Electronics, Massachusetts Institute of Technology (MIT)

  • Pablo Jarillo-Herrero

    Massachusetts Institute of Technology, Massachusetts Institute of Technology MIT, Department of Physics, Massachusetts Institute of Technology (MIT), Massachusetts Institute of Technology, Cambridge, MA, Massachusetts Inst of Tech-MIT

  • William Oliver

    Research Laboratory of Electronics, Department of Electrical Engineering and Computer Science, Department of Physics, MIT Lincoln Laboratory, Massachusetts Institute of Techn, MIT Lincoln Lab, MIT Lincoln Laboratory, MIT Lincoln Laboratory, Massachusetts Institute of Technology, Department of Physics, Department of Electrical Engineering and Computer Science, Research Laboratory of Electronics, Lincoln Laboratory, Massachusetts Institute of Technology, Research Laboratory of Electronics, Massachusetts Institute of Technology MIT, Massachusetts Institute of Technology MIT, Department of Electrical Engineering and Computer Science, Department of Physics, Massachusetts Institute of Technology; MIT Lincoln Laboratory, Department of Electrical Engineering and Computer Science, Department of Physics, MIT Lincoln Laboratory, Massachusetts Institute of Technology, Massachusetts Institute of Technology, Research Laboratory of Electronics, Massachusetts Institute of Technology, Research Laboratory of Electronics, Department of Electrical Engineering & Computer Science, Department of Physics, Massachusetts Institute of Technology and MIT Lincoln Labo, Physics, MIT, MIT-Lincoln Lab, MIT Lincoln Laboratories, Research Laboratory of Electronics, Department of Physics, Department of Electrical Engineering and Computer Science, Lincoln Laboratory, Massachusetts Institute of Technolog