Charge Engineering in Nickelate-based Mott Transistors Gated by Ferroelectrics
ORAL
Abstract
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Presenters
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Yifei Hao
University of Nebraska - Lincoln, Department of Physics and Astronomy & Nebraska Center for Materials and Nanoscience, University of Nebraska - Lincoln
Authors
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Yifei Hao
University of Nebraska - Lincoln, Department of Physics and Astronomy & Nebraska Center for Materials and Nanoscience, University of Nebraska - Lincoln
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Xuegang Chen
Department of Physics and Astronomy & Nebraska Center for Materials and Nanoscience, University of Nebraska - Lincoln
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Le Zhang
Department of Physics and Astronomy & Nebraska Center for Materials and Nanoscience, University of Nebraska - Lincoln
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Xia Hong
University of Nebraska - Lincoln, Department of Physics and Astronomy & Nebraska Center of Materials and Nanoscience, University of Nebraska - Lincoln, Department of Physics and Astronomy & Nebraska Center for Materials and Nanoscience, University of Nebraska - Lincoln