Advances in Scanned Probe Microscopy 4: Machine Learning for Correlative and Analytical Measurements in Scanning Probe Microscopy
FOCUS · J10 · ID: 355470
Presentations
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Surface Structure of α-Quartz(0001)
ORAL
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Presenters
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Kristen Burson
Hamilton College, Physics Department, Hamilton College
Authors
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Kristen Burson
Hamilton College, Physics Department, Hamilton College
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Georg H. Simon
Fritz-Haber Institute of the Max Planck Society
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Clare M. Munroe
Physics Department, Hamilton College
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Markus Heyde
Fritz-Haber Institute of the Max Planck Society
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H J Freund
Fritz-Haber Institute of the Max Planck Society
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Nonlinearity-induced frequency mixing in AFM: novel contrast imaging with machine learning
ORAL
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Presenters
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Greg Haugstad
Characterization Facility, University of Minnesota
Authors
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Greg Haugstad
Characterization Facility, University of Minnesota
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Andrew Avery
Unilever Research
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Stephan Hubig
Ecolab
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Rachel Rahn
Ecolab
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Alon McCormick
Dept. of Chem. Eng. and Mat. Sci., University of Minnesota
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Bing Luo
Characterization Facility, University of Minnesota
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Han Seung Lee
Characterization Facility, University of Minnesota
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Light Scattering and Localization by Dislocation Scattering Sites
ORAL
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Presenters
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Farbod Shafiei
University of Texas at Austin
Authors
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Farbod Shafiei
University of Texas at Austin
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Tommaso Orzali
SEMATECH
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Alexey Vert
SEMATECH
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Mohammad-Ali Miri
CUNY
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PY Hung
SEMATECH
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Man Hoi Wong
SEMATECH
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Andrea Alu
CUNY
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Gennadi Bersuker
The Aerospace Corporation
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Michael C Downer
Physics, University of Texas at Austin, University of Texas at Austin
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Native and induced surface charge-transfer doping of MoTe<sub>2</sub>
ORAL
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Presenters
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Gheorghe Stan
National Institute of Standards and Technology
Authors
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Gheorghe Stan
National Institute of Standards and Technology
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Cristian Ciobanu
Colorado School of Mines, Department of Mechanical Engineering and Materials Science Program, Colorado School of Mines
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Sri Ranga Jai Likith
Department of Mechanical Engineering and Materials Science Program, Colorado School of Mines
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Asha Rani
National Institute of Standards and Technology
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Siyuan Zhang
National Institute of Standards and Technology, Theiss Research and The National Institute of Standards and Technology
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Christina Hacker
National Institute of Standards and Technology, Physical Measurement Laboratory, National Institute of Standards & Technology
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Sergiy Krylyuk
NIST, National Institute of Standards and Technology
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Albert Davydov
NIST, National Institute of Standards and Technology
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A traveling salesperson and sparse sampling boost to quasiparticle interference mapping
ORAL
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Presenters
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Fabian Natterer
Department of Physics, University of Zurich
Authors
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Jens Oppliger
Department of Physics, University of Zurich
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Fabian Natterer
Department of Physics, University of Zurich
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Controlled Manipulation of Molecules: A New Pathway to Catalysis Research
ORAL
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Presenters
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Omur Dagdeviren
Yale University
Authors
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Omur Dagdeviren
Yale University
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Chao Zhou
Yale University
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Milica Todorovic
Department of Applied Physics, Aalto University, Aalto University
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Eric Altman
Yale University
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Udo Dietmar Schwarz
Yale University
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Optimal Bayesian experimental design for everyday measurements
ORAL
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Presenters
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Robert McMichael
NIST, National Institute of Standards and Technology
Authors
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Robert McMichael
NIST, National Institute of Standards and Technology
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Sergey Dushenko
University of Maryland and National Institute of Standards and Technology, University of Maryland, College Park/National Institute of Standards and Technology
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Kapildeb Ambal
University of Maryland and National Institute of Standards and Technology, University of Maryland, College Park/National Institute of Standards and Technology
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Defect Identification and Statistics Toolbox (DIST): A Tool for Automating Defect Analysis and Statistics Generation
ORAL
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Presenters
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Alana Gudinas
Univ of New Hampshire
Authors
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Alana Gudinas
Univ of New Hampshire
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Shawna Hollen
Univ of New Hampshire
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Jason P Moscatello
Textron Systems, Wilmington, MA
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Learning hidden structure of nanoscale spectroscopies with metric analysis
Invited
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Presenters
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Petro Maksymovych
Center for Nanophase Materials Sciences, Oak Ridge National Lab, Oak Ridge National Lab, Oak Ridge National Laboratory
Authors
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Petro Maksymovych
Center for Nanophase Materials Sciences, Oak Ridge National Lab, Oak Ridge National Lab, Oak Ridge National Laboratory
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