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In-situ measurement of strain evolution in 2D materials on flexible substrates using Raman spectroscopy.

POSTER

Abstract

Since its recent discovery, extensive research investigating the physical properties of Graphene and other similar two-dimensional (2D) materials has been performed. Graphene’s excellent mechanical properties, flexibility, and optical transparency make it a promising candidate for a variety of layered architectures and hybrid devices. A custom low profile testing device was designed and manufactured in-house for in-situ physical measurements of single and multilayer 2D materials on flexible substrates using Raman spectroscopy. The design of the device allows for accurate and consistent strain application of both uniaxial bending and uniaxial tension in 2D materials. Here we use the device to investigate bending induced strain evolution in 2D materials through observation of characteristic Raman spectra band shifts. 2D materials used here were prepared via chemical vapor deposition (CVD) and were transferred to the flexible substrates. Our results provide information on strain development, substrate interaction, and adhesion properties of the 2D material tested.

*Current affiliation for Dheyaa Alameri is University of Misan, Iraq.

Presenters

  • Marc Mezzacappa

    Mechanical Engineering, Saint Louis University

Authors

  • Marc Mezzacappa

    Mechanical Engineering, Saint Louis University

  • Henry Wright

    Physics, Saint Louis University

  • Dheyaa Alameri

    Saint Louis University, Physics, Saint Louis University

  • Mary Conley

    Physics, Chemistry, Saint Louis University

  • Chi Hou Lei

    Mechanical Engineering, Saint Louis University

  • Irma Kuljanishvili

    Saint Louis University, Physics, Saint Louis University