APS Logo

Electrostatically control interfacial states for stackable electronics

POSTER

Abstract

Semiconducting monolayer of transition metal dichalcogenides (TMD) is ideal fundamental unit for stackable electronics because of its excellent optoelectronic properties. However, further applications are hindered with various issues from trap states of the monolayers. Here we develop a method to effectively engineer trap states of the monolayer MoS2 for excellent optoelectronic performances, including ultrahigh photoresponsivity (R) of 102~104 A/W, high sensitivity (D*) of 1011~1012 Jones and large absorbance. A scalable image sensor array of CVD-grown MoS2 monolayer is demonstrated.

Presenters

  • Chen Po-Han

    National Tsing-Hua University, Materials Science and Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan, National Taiwan Normal Univ

Authors

  • Chen Po-Han

    National Tsing-Hua University, Materials Science and Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan, National Taiwan Normal Univ

  • Yu-Ting Lin

    National Tsing-Hua University, Materials Science and Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan, National Taiwan Normal Univ

  • Chun-An Chen

    Materials Science and Engineering, National Tsing Hua University, National Tsing-Hua University, Materials Science and Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan

  • Yi-Cheng Chiang

    Materials Science and Engineering, National Tsing Hua University, National Tsing-Hua University, Materials Science and Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan, National Taiwan Normal Univ

  • I-Tung Chen

    National Tsing-Hua University, Materials Science and Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan, National Taiwan Normal Univ

  • Yi-Hsien Lee

    Materials Science and Engineering, National Tsing Hua University, National Tsing-Hua University, Materials Science and Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan, National Taiwan Normal Univ