Intrinsic Exchange Bias in Epitaxial CoFe2O4 thin film
ORAL
Abstract
Exchange bias (EB), traditionally known as an interface phenomenon between ferro- or ferrimagnetic (FM) materials and antiferromagnetic (AFM) materials, has been successfully applied in magnetic storage and spintronic devices. Recently, surprising “intrinsic” EB (IEB) effects without a nominal AFM layer have drawn much attention. To ascertain the mechanism of IEB, we grew CoFe2O4 thin films epitaxially on sapphire (0001) substrates by pulsed laser deposition and studied its magnetometry by superconducting quantum interference device. In this single film, magnetization loops indicate the coexistence of a soft and a hard FM component, while the observed EB effect ---their clear shifts from the origin, suggest the existence of another AFM component. Analyses based on Preisach model demonstrate that only the hard FM component contributes to the EB. Thickness and temperature dependent EB and coercivity signatures are also extracted from these triple-component hysteresis loops. Our experiment suggests a potential application of adjustable EB and provide new platforms to study the elusive mechanism of intrinsic EB.
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Presenters
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Detian Yang
Physics & Astronomy, University of Nebraska-Lincoln
Authors
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Detian Yang
Physics & Astronomy, University of Nebraska-Lincoln
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Xiaoshan Xu
University of Nebraska - Lincoln, Department of Physics and Astronomy and Nebraska Center for Materials and Nanoscience, University of Nebraska, Department of Physics and Astronomy, University of Nebraska - Lincoln, Physics & Astronomy, University of Nebraska-Lincoln, Department of Physics and Astronomy, University of Nebraska
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Yu Yun
University of Nebraska - Lincoln, Physics & Astronomy, University of Nebraska-Lincoln