NV<sup>-</sup> center magnetometry using Bayesian statistics
ORAL
Abstract
In magnetometry using NV- centers, we demonstrate order-of-magnitude speed up with Bayesian experimental design as compared to conventional frequency-swept measurements.
The NV- center is a quantum defect with spin 1 and coherence time up to several milliseconds at room temperature. Zeeman splitting of NV- energy levels allows detection of the magnetic field via photoluminescence. It is an excellent platform for magnetometry with potential spatial resolution down to few nanometers and demonstrated sensitivity down to nT/Hz1/2.
We compare conventional magnetic field measurement of fluorescence under pre-determined sweeps of microwave frequency with the measurement using a Bayesian statistics methodology. In the Bayesian experimental design, the frequency of each measurement is determined in real-time from utility predictions based on the accumulated experimental data. We report order of magnitude increase in the precision of magnetic field and hyperfine splitting determination for the same measurement time in the Bayesian scheme, compared with the conventional scheme.
The NV- center is a quantum defect with spin 1 and coherence time up to several milliseconds at room temperature. Zeeman splitting of NV- energy levels allows detection of the magnetic field via photoluminescence. It is an excellent platform for magnetometry with potential spatial resolution down to few nanometers and demonstrated sensitivity down to nT/Hz1/2.
We compare conventional magnetic field measurement of fluorescence under pre-determined sweeps of microwave frequency with the measurement using a Bayesian statistics methodology. In the Bayesian experimental design, the frequency of each measurement is determined in real-time from utility predictions based on the accumulated experimental data. We report order of magnitude increase in the precision of magnetic field and hyperfine splitting determination for the same measurement time in the Bayesian scheme, compared with the conventional scheme.
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Presenters
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Sergey Dushenko
University of Maryland and National Institute of Standards and Technology, University of Maryland, College Park/National Institute of Standards and Technology
Authors
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Sergey Dushenko
University of Maryland and National Institute of Standards and Technology, University of Maryland, College Park/National Institute of Standards and Technology
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Kapildeb Ambal
University of Maryland and National Institute of Standards and Technology, University of Maryland, College Park/National Institute of Standards and Technology
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Robert McMichael
NIST, National Institute of Standards and Technology