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Controlling Number of Dopants per Site in Si:P Quantum Devices

ORAL

Abstract

STM-based fabrication of atomically precise Si:P structures has been demonstrated as a promising platform for the realization of dopant-based qubit quantum computing. There is a growing broader interest in applying this technique to other quantum systems in Si, for example artificial lattices to engineer band structure, as well as arrays of atoms acting as tunable Hubbard simulators. We present results from a single-atom transistor and few-atom cluster transistors demonstrating the effect that the number of dopants per site has on the energy spectrum of these devices, with the important implication that for many applications of interest it will be necessary to control this parameter with absolute precision. We detail our efforts using STM-based feedback-controlled techniques to engineer placement and number of dopants per site with the goal of reducing the fabrication uncertainty of dopants per site to zero.

Presenters

  • Jonathan Wyrick

    National Institute of Standards and Technology

Authors

  • Jonathan Wyrick

    National Institute of Standards and Technology

  • Xiqiao Wang

    National Institute of Standards and Technology

  • Ranjit Kashid

    National Institute of Standards and Technology

  • Pradeep Namboodiri

    National Institute of Standards and Technology

  • Fan Fei

    University of Maryland, College Park, National Institute of Standards and Technology

  • richard Silver

    National Institute of Standards and Technology