Models and Simulations of Electric Field-Biased Nanoparticle Self-Assembly
POSTER
Abstract
We design, model, and simulate an experiment to study the effect of electric bias on particle-coverage densities produced during ionic nanoparticle self-assembly. The experiment involves the application of a uniform external electric field parallel to a glass substrate during the
self-assembly of silica nanoparticles. We refer to this procedure as directed self-assembly of monolayers (DSAM). In our theoretical analysis, we modify existing cooperative sequential adsorption models to account for diffusion under an applied electric field. We use the mean field
approximation to solve for particle-coverage densities. To ascertain the validity of this method, we compare our solutions to Monte Carlo simulations of the system.
self-assembly of silica nanoparticles. We refer to this procedure as directed self-assembly of monolayers (DSAM). In our theoretical analysis, we modify existing cooperative sequential adsorption models to account for diffusion under an applied electric field. We use the mean field
approximation to solve for particle-coverage densities. To ascertain the validity of this method, we compare our solutions to Monte Carlo simulations of the system.
Presenters
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Matthew Withers
Washington & Lee Univ
Authors
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Matthew Withers
Washington & Lee Univ
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Elise Baker
Washington & Lee Univ
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Benjamin Wood Zeman
Washington & Lee Univ
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Nolan Zunk
Washington & Lee Univ
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Cory Morris
Washington & Lee Univ
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Dan Mazilu
Washington & Lee Univ
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Irina Mazilu
Washington & Lee Univ