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Models and Simulations of Electric Field-Biased Nanoparticle Self-Assembly

POSTER

Abstract

We design, model, and simulate an experiment to study the effect of electric bias on particle-coverage densities produced during ionic nanoparticle self-assembly. The experiment involves the application of a uniform external electric field parallel to a glass substrate during the
self-assembly of silica nanoparticles. We refer to this procedure as directed self-assembly of monolayers (DSAM). In our theoretical analysis, we modify existing cooperative sequential adsorption models to account for diffusion under an applied electric field. We use the mean field
approximation to solve for particle-coverage densities. To ascertain the validity of this method, we compare our solutions to Monte Carlo simulations of the system.

Presenters

  • Matthew Withers

    Washington & Lee Univ

Authors

  • Matthew Withers

    Washington & Lee Univ

  • Elise Baker

    Washington & Lee Univ

  • Benjamin Wood Zeman

    Washington & Lee Univ

  • Nolan Zunk

    Washington & Lee Univ

  • Cory Morris

    Washington & Lee Univ

  • Dan Mazilu

    Washington & Lee Univ

  • Irina Mazilu

    Washington & Lee Univ