Study on the cavity photon induced dephasing of a transmon qubit in circuit QED due to the measurement microwave leakage
POSTER
Abstract
[1] D. I. Schuster et al., Phys. Rev. Lett. 94, 123602 (2005).
[2] J. Gambetta et al., Phys. Rev. A 74, 042318 (2006).
Presenters
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Gahyun Choi
Korea Research Institute of Standards and Science, Korea Research Inst of Standards and Science (KRISS)
Authors
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Jisoo Choi
Korea Research Inst of Standards and Science (KRISS), Korea University
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Gahyun Choi
Korea Research Institute of Standards and Science, Korea Research Inst of Standards and Science (KRISS)
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Gwanyeol Park
Korea Research Inst of Standards and Science (KRISS), Korea University
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Jinsu Son
Korea Research Inst of Standards and Science (KRISS)
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Kwan-Woo Lee
Division of Display and Semiconductor Physics, Korea University, Division of Display and Semiconductor Physics, Korea University, Sejong, Korea University
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Soon-Gul Lee
Korea University
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Woon Song
Korea Research Inst of Standards and Science (KRISS)
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Yonuk Chong
Korea Research Institute of Standards and Science, Korea Research Inst of Standards and Science (KRISS), University of Science and Technology (UST)