Application of edge detection techniques to ARPES data
POSTER
Abstract
Edge detection and similar image analysis techniques are commonly used in computer vision but have not been fully realized for the purpose of ARPES data analysis. Without applying any Image analysis, the interpretation of ARPES data is left to the eyes of researchers and can be tricky and unreliable due to many sources of noise and distortion from the experimental processes, as a result, some of the finer, defining, details required to classify a material can be missed. By applying edge detection techniques, we are able to highlight key features such as distinct, clustered bands and other fine details that may otherwise have been obscured by noise and other experimental artefacts. Here we show the implementations of various image processing techniques applied to ARPES data and how they not only aid the interpretation of results, but can also be looked upon as stepping stones for better data processing techniques and potential automation of the classification of quantum materials through ARPES.
Presenters
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Luis Persaud
Univ of Central Florida
Authors
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Luis Persaud
Univ of Central Florida
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Christopher Sims
Univ of Central Florida, Physics, University of Central Florida, University of Central Florida
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Gyanendra Dhakal
Univ of Central Florida, Physics, University of Central Florida, University of Central Florida
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Firoza Kabir
Univ of Central Florida, Physics, University of Central Florida, University of Central Florida
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Md Mofazzel Hosen
Univ of Central Florida
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Yangyang Liu
Univ of Central Florida
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Sabin Regmi
Univ of Central Florida, Physics, University of Central Florida, University of Central Florida
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Klauss Dimitri
Univ of Central Florida, Physics, University of Central Florida, University of Central Florida
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Madhab Neupane
Univ of Central Florida