Autonomous X-ray Scattering
Invited
Abstract
This talk will cover ongoing work to develop autonomous experimentation at a synchrotron x-ray scattering beamline. Deep learning (convolutional neural networks) is used to classify x-ray detector images, with performance improving when domain-specific data transformations are exploited ("physics-aware machine-learning"). These methods can be combining with customized data healing algorithms. To close the autonomous loop, we deploy a general-purpose algorithm that selects high-value experiments to conduct, attempting to minimize both uncertainty and experimental cost. Examples from recent autonomous experiments will be presented, including measuring nanoparticle ordering, combinatorial libraries of block copolymer materials, and realtime photo-thermal processing.
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Presenters
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Kevin Yager
Brookhaven National Laboratory, Center for Functional Nanomaterials, Brookhaven National Laboratory
Authors
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Kevin Yager
Brookhaven National Laboratory, Center for Functional Nanomaterials, Brookhaven National Laboratory
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Masafumi Fukuto
Brookhaven National Laboratory
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Ruipeng Li
Brookhaven National Laboratory
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Gregory Doerk
Brookhaven National Laboratory
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Pawel W Majewski
University of Warsaw
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Marcus Noack
CAMERA, Lawrence Berkeley National Laboratory, Lawrence Berkeley National Laboratory