Advances in Scanned Probe Microscopy 2: High Frequencies and Optical Techniques
FOCUS · B10 · ID: 355468
Presentations
-
Measurement of fluorescent quantum yield using photothermal deflection spectroscopy
ORAL
–
Presenters
-
Stephen Johnson
Transylvania Univ
Authors
-
Stephen Johnson
Transylvania Univ
-
Brandon T Couch
Transylvania Univ
-
Andrew Meyer
Transylvania Univ
-
Brandon Heller
Transylvania Univ
-
-
Imaging chiral optical excitations through inelastic electron-light scattering
ORAL
–
Presenters
-
Tyler Harvey
IV. Physicalisches Institut, University of Göttingen
Authors
-
Tyler Harvey
IV. Physicalisches Institut, University of Göttingen
-
Jan-Wilke Henke
IV. Physicalisches Institut, University of Göttingen
-
Ofer Kfir
IV. Physicalisches Institut, University of Göttingen
-
Claus Ropers
IV. Physicalisches Institut, University of Göttingen
-
-
Visualization of Surface Acoustic Wave by Transmission Mode Microwave Impedance Microscopy
ORAL
–
Presenters
-
Lu Zheng
University of Texas at Austin
Authors
-
Lu Zheng
University of Texas at Austin
-
Linbo Shao
Harvard University
-
Qicheng Zhang
University of Pennsylvania, Physics, University of Pennsylvania
-
Alan T Johnson
University of Pennsylvania, Department of Physics and Astronomy, University of Pennsylvania, Physics, University of Pennsylvania
-
Marko Loncar
Harvard University, John A. Paulson School of Engineering and Applied Sciences, Harvard University
-
Keji Lai
University of Texas at Austin
-
-
Experimental and numerical studies of near-field infrared phenomena at nanometer length scales
ORAL
–
Presenters
-
P. McArdle
Department of Physics, College of William & Mary, Department of Physics, College of William and Mary
Authors
-
P. McArdle
Department of Physics, College of William & Mary, Department of Physics, College of William and Mary
-
D. Lahneman
Department of Physics, College of William & Mary, Department of Physics, College of William and Mary
-
H. Jiang
Department of Physics, College of William & Mary, Department of Physics, College of William and Mary
-
M. M. Qazilbash
Department of Physics, College of William & Mary, Department of Physics, College of William and Mary
-
T. Slusar
Metal-Insulator-Transition Laboratory, Electronics and Telecommunications Research Institute (ETRI), Metal-Insulator Transition Laboratory,Electronics and Telecommunications Research Institute
-
H.-T. Kim
Metal-Insulator-Transition Laboratory, Electronics and Telecommunications Research Institute (ETRI), ETRI, Metal-Insulator Transition Laboratory,Electronics and Telecommunications Research Institute
-
A. Biswas
Department of Physics, University of Florida, Department of Physics, University of Florida, Gainesville, FL 32611
-
F. Keilmann
Fakultät für Physik & Center for NanoScience (CeNS), Ludwig-Maximilians-Universität
-
J. Chen
Department of Chemistry and Biochemistry, University of Arkansas
-
-
Time-Resolved Scanning Probe Techniques – Inspecting the Dynamical Properties of Nanoscale Solids in Real Space and Real Time
Invited
–
Presenters
-
Lukas Eng
TU Dresden
Authors
-
Lukas Eng
TU Dresden
-