Nanocharacterization of 2D Hybrid Materials by Near-Field Microscopy
ORAL
Abstract
Methods of Near-Field Microscopy are high-throughput non-destructive techniques, which can be used for characterization of 2D Hybrid Materials with sub-micrometer resolution as well as for device inspection. Here we show near field data on 2D samples with various electronic properties, from metals to semiconductors. Simple physical models are proposed for near-field analysis.
–
Presenters
-
Tetyana Ignatova
Joint School of Nanoscience and Nanoengineering, University of North Carolina at Greensboro, Nanoscience, Univ of NC - Greensboro
Authors
-
Tetyana Ignatova
Joint School of Nanoscience and Nanoengineering, University of North Carolina at Greensboro, Nanoscience, Univ of NC - Greensboro
-
Slava V. Rotkin
Engineering Science and Mechanics, Penn State University