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Gate-Dependent Transport in Multi-Terminal Josephson Junctions

ORAL

Abstract

Josephson coupling of three or more superconducting leads through a material with few conducting modes has been predicted to give rise to topological effects. Such behavior, of relevance for topologically-protected quantum bits, would lead to specific transport features measured between terminals, with topological phase transitions occurring as a function of relative phase and voltage biases. Here we study the effects on transport of several top-gating arrangements on multi-terminal Josephson junctions with many conducting modes based on an InAs 2DEG proximitized with an epitaxial aluminum layer and many conducting modes. The superconducting features can be accurately simulated by a network of RCSJ junctions. [1]

1. G. V. Graziano, J. S. Lee, M. Pendharkar, C. J. Palmstrom and V. S. Pribiag. arXiv:1905.11730 (2019)

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Presenters

  • Gino Graziano

    University of Minnesota

Authors

  • Gino Graziano

    University of Minnesota

  • Joon Sue Lee

    California Nano-Systems Institute, Univ. of California, Santa Barbara, CA, USA, University of Tennessee Knoxville, Univ of California, Santa Barbara, Physics & Astronomy, Seoul National University, University of California Santa Barbara, California Nanosystems Institute, University of California Santa Barbara, University of California, Santa Barbara

  • Sean Harrington

    Materials Department, University of California, Santa Barbara, Dept. of Materials Engineering, Univ. of California, Santa Barbara, CA, USA, IEE, UC Santa Barbara, Univ of California, Santa Barbara, University of California, Santa Barbara

  • Mihir Pendharkar

    Dept. of Electrical Engineering, Univ. of California, Santa Barbara, CA, USA, IEE, UC Santa Barbara, University of California Santa Barbara, Univ of California, Santa Barbara, Electrical and Computer Engineering, University of California Santa Barbara, Electrical & Computer Engineering, University of California, Santa Barbara, University of California, Santa Barbara

  • Chris J Palmstrom

    Materials Department, University of California, Santa Barbara, UCSB, Departments of Electrical and Computer Engineering and Materials, University of California, Santa Barbara, Dept. of Electrical Engineering, Univ. of California, Santa Barbara, CA, USA, Univ. of California, Santa Barbara, Electrical and Computer Engineering Department, University of California, Santa Barbara, University of California, Santa Barbara, IEE, UC Santa Barbara, University of California Santa Barbara, Univ of California, Santa Barbara, Electrical and Computer Engineering, University of California Santa Barbara, Materials and Electrical & Comp. Eng, University of California, Santa Barbara

  • Vlad Pribiag

    University of Minnesota, School pf Physics and Astronomy, University of Minnesota, School of Physics and Astronomy, University of Minnesota