Operando study of chiral magnetic textures under electrical bias using Lorentz scanning transmission electron microscopy
ORAL
Abstract
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Presenters
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Albert Park
School of Applied and Engineering Physics, Cornell University
Authors
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Albert Park
School of Applied and Engineering Physics, Cornell University
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Zhen Chen
Applied and Engineering Physics, Cornell University, Cornell University, School of Applied and Engineering Physics, Cornell University
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Lijun Zhu
Cornell University, School of Applied and Engineering Physics, Cornell University
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Robert Buhrman
School of Applied and Engineering Physics, Cornell University, Cornell University, Physics, Cornell University
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David Muller
Cornell University, School of Applied and Engineering Physics, Cornell University, Applied and Engineering Physics, Cornell University
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Gregory Fuchs
Cornell University, School of Applied and Engineering Physics, Cornell University