Dual critical thickness for lattice and electronic instabilities in the LaAlO$_{3}$/SrTiO$_{3}$ interface.
ORAL
Abstract
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Authors
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G. Herranz
ICMAB-CSIC Barcelona, Institute for Materials Science of Barcelona ICMAB-CSIC
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J. Gazquez
Institute for Materials Science of Barcelona ICMAB-CSIC
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M. Stengel
ICMAB-CSIC, Institute for Materials Science of Barcelona ICMAB-CSIC
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M. Scigaj
Institute for Materials Science of Barcelona ICMAB-CSIC
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F. Sanchez
ICMAB-CSIC Barcelona, Institute for Materials Science of Barcelona ICMAB-CSIC
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J. Fontcuberta
Institute for Materials Science of Barcelona ICMAB-CSIC, ICMAB-CSIC Barcelona
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R. Mishra
Washington University in St. Louis, USA
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M. Roldan
Imaging and Characterization Core Lab, King Abdullah University of Science and Technology (KAUST), Thuwal 23955-6900, Saudi Arabia, KAUST, Universidad Complutense de Madrid
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M. Varela
Universidad Complutense de Madrid