Black phosphorus edges: a polarized Raman study

ORAL

Abstract

Black phosphorus (BP) has been recently exfoliated down to few-layer thicknesses revealing numerous interesting features such as a tunable direct bandgap. Ever since, demonstrations of BP electronic devices have bloomed, as well as studies of the electric, optical, mechanical and thermal properties of its bulk and few-layer forms. However, the edges of BP crystals have, so far, been poorly characterized, even though the terminations of layered crystals are known to possess a range of interesting properties. In this work, the edges of exfoliated BP flakes are characterized by polarized confocal Raman spectroscopy. We will present experimental Raman spectra at zigzag and armchair edges, as well as density functional theory calculations that explain the peculiarities of the experimental data.

Authors

  • H Ribeiro

    Mackgraphe-Mackenzie University

  • Cesar E P Villegas

    IFT-UNESP, Instituto de Fisica Teorica - Unesp, Sao Paulo, Brazil

  • Dario Bahamon

    Mackenzie Presbyterian University, Mackgraphe-Mackenzie University

  • Antonio H. Castro Neto

    Natl Univ of Singapore, CA2DM and GRC, National University of Singapore, Centre for Advanced 2D Materials and Graphene Research Centre, National University of Singapore

  • E de Souza

    Mackgraphe-Mackenzie University

  • Alexandre R. Rocha

    IFT-UNESP, Instituto de Fisica Teorica - Unesp, Sao Paulo, Brazil, IFT-UNESP, Brazil

  • Marcos Pimenta

    Departamento de F\'{i}sica, UFMG, Departamento de Fisica, Universidade Federal de Minas Gerais

  • Christiano J. S. de Matos

    Mackgraphe-Mackenzie University, MackGraphe, Mackenzie Presbyterian University