Enhanced Tunneling Electroresistance by Interfacial Phase Transitions in Ultrathin Oxide Heterojunctions

ORAL

Abstract

The ferroelectric (FE) control of electronic transport is one of the emerging technologies. Many previous studies in FE tunnel junctions (FTJs) exploited solely the differences in the electrostatic potential across the FTJs that are induced by changes in the FE polarization direction. In this work, by using ultrathin PbZr$_{0.2}$Ti$_{0.8}$O$_{3}$/(La,Sr)MnO$_{3}$ heterojunctions, we present that in practice the junction current ratio between the two polarization states can be further enhanced when correlated electron oxides are used as electrodes, and that FTJs with nanometer thin layers can effectively produce a considerably large electroresistance ratio at room temperature. To understand these surprising results, we employed an additional control parameter, which is related to the crossing of electronic and magnetic phase boundaries of the correlated electron oxide. Our study highlights that the strong coupling between degrees of freedom across heterointerfaces could yield versatile and novel applications in oxide electronics. *The work was supported by the U.S. Department of Energy, Basic Energy Sciences, Materials Sciences and Engineering Division.

Authors

  • Lu Jiang

    University of Tennessee

  • Woo seok Choi

    Oak Ridge National Lab

  • H. Jeen

    Oak Ridge National Lab, Oak Ridge National Laboratory, USA.

  • Shuai Dong

    Southeast University

  • Yunseok Kim

    Oak Ridge National Lab

  • Takeshi Egami

    University of Tennessee

  • Ho Nyung Lee

    Oak Ridge National Lab, Oak Ridge National Laboratory, USA, Oak Ridge National Laboratory

  • S. Kalinin

    Oak Ridge National Lab, Oak Ridge National Laboratory, Oak Ridge, TN, Oak Ridge National Laboratory, CNMS, ORNL, Oak Ridge, TN 37831, USA

  • Elbio Dagotto

    University of Tennessee, The University of Tennessee and Oak Ridge National Laboratory, University of Tennessee, Knoxville