Low-Power Dispersive Measurements of High-Coherence Flux Qubits

ORAL

Abstract

We report on progress towards nondestructive dispersive measurements of a high-coherence flux qubit. A~capacitively shunted flux qubit that incorporates high-Q MBE aluminum will have longer relaxation and dephasing times when compared to a conventional flux qubit, while also maintaining the large anharmonicity necessary for complex gate operations. We numerically investigate the expected measurement fidelity of the improved qubit and present measurements that explore the boundary between destructive and nondestructive dispersive readout. This research was funded in part by the Office of the Director of National Intelligence (ODNI), Intelligence Advanced Research Projects Activity (IARPA); and by the Assistant Secretary of Defense for Research {\&} Engineering under Air Force Contract number FA8721-05-C-0002.~ All statements of fact, opinion or conclusions contained herein are those of the authors and should not be construed as representing the official views or policies of IARPA, the ODNI, or the U.S. Government

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Authors

  • David Hover

    MIT Lincoln Laboratory

  • A.P. Sears

    MIT Lincoln Laboratory

  • Theodore Gudmundsen

    MIT Lincoln Laboratory

  • Andrew Kerman

    MIT Lincoln Laboratory

  • Paul Welander

    MIT Lincoln Laboratory

  • Jonilyn L. Yoder

    MIT Lincoln Laboratory

  • Archana Kamal

    Research Laboratory of Electronics, Massachusetts Institute of Technology, Massachusetts Institute of Technology

  • Simon Gustavsson

    Massachusetts Institute of Technology, Research Laboratory of Electronics, Massachusetts Institute of Technology, MIT

  • Xiaoyue Jin

    Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, Research Laboratory of Electronics, Massachusetts Institute of Technology

  • J. Birenbaum

    Department of Physics, University of California, Berkeley

  • John Clarke

    Department of Physics, University of California, Berkeley, University of California, Berkeley, Dale Van Harlingen, University of Illinois at Urbana-Champaign, University of California Berkeley

  • William Oliver

    MIT Lincoln Laboratory, MIT Lincoln Laboratory; Research Laboratory of Electronics, Massachusetts Institute of Technology