Variable temperature nano-optics in correlated electronic systems

ORAL

Abstract

We report on the development and performance of instrumentation designed to study nano-scale optical properties of correlated electronic systems in a cryogenic environment. The main capability of our Variable-Temperature scattering-based Scanning Near-Field Optical Microscope (VT-SNOM) is to measure the complex dielectric function with a spatial resolution of 20-30 nm in a 10 K - 300 K temperature range. VT-SNOM measurements around the metal-insulator transition on 20 nm thick subsurface EuO films will be presented.

–

Authors

  • Adrian Gozar

    Brookhaven National Laboratory

  • Rainer Held

    Department of Materials Science and Engineering Cornell University, USA

  • Darrell Schlom

    Cornell University, Department of Materials Science and Engineering, Cornell University, Cornell Univ, Department of Materials Science and Engineering, Cornell University,, Department of Materials Science and Engineering Cornell University, USA